Class information for:
Level 1: ELECTRO OPTIC SAMPLING//ELECTROOPTIC MEASUREMENTS//ELECTROOPTIC PROBING

Basic class information

Bar chart of Publication_year

Last years might be incomplete

Hierarchy of classes

The table includes all classes above and classes immediately below the current class.



Cluster id Level Cluster label #P
1 4 PHYSICS, CONDENSED MATTER//PHYSICS, APPLIED//MATERIALS SCIENCE, MULTIDISCIPLINARY 2188495
519 3       TERAHERTZ//TERAHERTZ TIME DOMAIN SPECTROSCOPY//TERAHERTZ SPECTROSCOPY 21306
1536 2             PHOTODIODE//PHOTODETECTORS//ENGINEERING, ELECTRICAL & ELECTRONIC 7706
13988 1                   ELECTRO OPTIC SAMPLING//ELECTROOPTIC MEASUREMENTS//ELECTROOPTIC PROBING 830

Terms with highest relevance score



rank Category termType chi_square shrOfCwithTerm shrOfTermInClass termInClass
1 ELECTRO OPTIC SAMPLING authKW 401034 3% 41% 26
2 ELECTROOPTIC MEASUREMENTS authKW 256615 2% 48% 14
3 ELECTROOPTIC PROBING authKW 151882 0% 100% 4
4 ELECTROOPTIC SAMPLING EOS authKW 151882 0% 100% 4
5 TERAHERTZ MEDIA SYST address 143114 1% 54% 7
6 ROTATION MAGNETIZATION authKW 121504 0% 80% 4
7 ELECTROOPTIC EO MEASUREMENTS authKW 113912 0% 100% 3
8 PHOTOCONDUCTIVE MEASUREMENT authKW 113912 0% 100% 3
9 NEAR FIELD RADIATION PATTERNS authKW 85432 0% 75% 3
10 ULTRAFAST OPT SCI RADIAT address 85432 0% 75% 3

Web of Science journal categories



chi_square_rank Category chi_square shrOfCwithTerm shrOfTermInClass termInClass
1 Engineering, Electrical & Electronic 5644 49% 0% 403
2 Optics 4145 30% 0% 249
3 Physics, Applied 3963 45% 0% 372
4 Instruments & Instrumentation 526 9% 0% 72
5 Nanoscience & Nanotechnology 95 5% 0% 39
6 Spectroscopy 90 3% 0% 29
7 Telecommunications 86 3% 0% 28
8 Engineering, General 23 2% 0% 15
9 Physics, Condensed Matter 19 5% 0% 40
10 COMPUTER APPLICATIONS & CYBERNETICS 13 0% 0% 1

Address terms



chi_square_rank term chi_square shrOfCwithTerm shrOfTermInClass termInClass
1 TERAHERTZ MEDIA SYST 143114 1% 54% 7
2 ULTRAFAST OPT SCI RADIAT 85432 0% 75% 3
3 BERUNI PHYS TECH 75941 0% 100% 2
4 ABT ALLGEMEINE ELEKTRO TECH MICKROELEKT 37971 0% 100% 1
5 CHINA STATE INTEGRATED OPTOELECT 37971 0% 100% 1
6 CITY ELECT ENGN 37971 0% 100% 1
7 CNRS URA 0820 37971 0% 100% 1
8 DASSAULT ELE ON 37971 0% 100% 1
9 DETECTOR RADIOMETRY 37971 0% 100% 1
10 FG ALLGEMEINE THEORET ELEKTROTECH 37971 0% 100% 1

Journals



chi_square_rank term chi_square shrOfCwithTerm shrOfTermInClass termInClass
1 IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES 9804 7% 0% 58
2 APPLIED PHYSICS LETTERS 4970 15% 0% 122
3 IEEE MICROWAVE AND GUIDED WAVE LETTERS 4501 1% 1% 10
4 OPTICAL AND QUANTUM ELECTRONICS 3945 3% 1% 21
5 MICROELECTRONIC ENGINEERING 3710 4% 0% 32
6 PROCEEDINGS OF THE SOCIETY OF PHOTO-OPTICAL INSTRUMENTATION ENGINEERS 3379 3% 0% 22
7 IEICE TRANSACTIONS ON ELECTRONICS 2998 3% 0% 22
8 IEEE JOURNAL OF QUANTUM ELECTRONICS 2729 3% 0% 25
9 ELECTRONICS LETTERS 2618 6% 0% 53
10 LASER FOCUS WITH FIBEROPTIC TECHNOLOGY 1471 0% 2% 2

Author Key Words



chi_square_rank term chi_square shrOfCwithTerm shrOfTermInClass termInClass LCSH search Wikipedia search
1 ELECTRO OPTIC SAMPLING 401034 3% 41% 26 Search ELECTRO+OPTIC+SAMPLING Search ELECTRO+OPTIC+SAMPLING
2 ELECTROOPTIC MEASUREMENTS 256615 2% 48% 14 Search ELECTROOPTIC+MEASUREMENTS Search ELECTROOPTIC+MEASUREMENTS
3 ELECTROOPTIC PROBING 151882 0% 100% 4 Search ELECTROOPTIC+PROBING Search ELECTROOPTIC+PROBING
4 ELECTROOPTIC SAMPLING EOS 151882 0% 100% 4 Search ELECTROOPTIC+SAMPLING+EOS Search ELECTROOPTIC+SAMPLING+EOS
5 ROTATION MAGNETIZATION 121504 0% 80% 4 Search ROTATION+MAGNETIZATION Search ROTATION+MAGNETIZATION
6 ELECTROOPTIC EO MEASUREMENTS 113912 0% 100% 3 Search ELECTROOPTIC+EO+MEASUREMENTS Search ELECTROOPTIC+EO+MEASUREMENTS
7 PHOTOCONDUCTIVE MEASUREMENT 113912 0% 100% 3 Search PHOTOCONDUCTIVE+MEASUREMENT Search PHOTOCONDUCTIVE+MEASUREMENT
8 NEAR FIELD RADIATION PATTERNS 85432 0% 75% 3 Search NEAR+FIELD+RADIATION+PATTERNS Search NEAR+FIELD+RADIATION+PATTERNS
9 ELECTROMAGNETIC FIELD IMAGING 75941 0% 100% 2 Search ELECTROMAGNETIC+FIELD+IMAGING Search ELECTROMAGNETIC+FIELD+IMAGING
10 INTERNAL CIRCUIT TESTING 75941 0% 100% 2 Search INTERNAL+CIRCUIT+TESTING Search INTERNAL+CIRCUIT+TESTING

Core articles

The table includes core articles in the class. The following variables is taken into account for the relevance score of an article in a cluster c:
(1) Number of references referring to publications in the class.
(2) Share of total number of active references referring to publications in the class.
(3) Age of the article. New articles get higher score than old articles.
(4) Citation rate, normalized to year.

Classes with closest relation at Level 1



rank cluster_id2 link
1 28808 FB ET//LEHRSTUHL HOCHFREQUENZTECH OPTOELEKT//OPTICAL CONTROL
2 24425 PHOTOCONDUCTIVE SEMICONDUCTOR SWITCH//PHOTOCONDUCTIVE SEMICONDUCTOR SWITCHES PCSSS//ULTRAFAST PHOTOELECT TECHNOL
3 22547 E BEAM INSPECTION//ELECTRON BEAM TESTING//NONVISUAL DEFECTS
4 25809 ADV SUBSUR E IMAGING//SAMPLING OSCILLOSCOPE//TRANSITION DURATION
5 4044 LT GAAS//LOW TEMPERATURE GROWN GAAS//PHOTOCONDUCTIVE ANTENNA
6 9654 METAL SEMICONDUCTOR METAL STRUCTURES//MO N SI MO//PLANAR METAL SEMICONDUCTOR METAL STRUCTURE
7 18004 ANTENNA FACTOR//ELECTRIC FIELD SENSOR//PYRAMIDAL HORN
8 9079 MODE LOCKED LASERS//OPTICAL PULSE GENERATION//SEMICONDUCTOR LASERS
9 28628 PICOSECOND PHOTOINDUCED ABSORPTION//BEREICH SOLARE ENERGET//CNRSGRP OPT NONLINEAIRE OPTOELECT
10 20579 NONLINEAR TRANSMISSION LINE//NONLINEAR TRANSMISSION LINES NLTLS//ELECTRICAL SOLITONS

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