Class information for: |
Basic class information |
Hierarchy of classes |
The table includes all classes above and classes immediately below the current class. |
Cluster id | Level | Cluster label | #P |
---|---|---|---|
1 | 4 | PHYSICS, CONDENSED MATTER//PHYSICS, APPLIED//MATERIALS SCIENCE, MULTIDISCIPLINARY | 2188495 |
519 | 3 | TERAHERTZ//TERAHERTZ TIME DOMAIN SPECTROSCOPY//TERAHERTZ SPECTROSCOPY | 21306 |
1536 | 2 | PHOTODIODE//PHOTODETECTORS//ENGINEERING, ELECTRICAL & ELECTRONIC | 7706 |
13988 | 1 | ELECTRO OPTIC SAMPLING//ELECTROOPTIC MEASUREMENTS//ELECTROOPTIC PROBING | 830 |
Terms with highest relevance score |
rank | Category | termType | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
---|---|---|---|---|---|---|
1 | ELECTRO OPTIC SAMPLING | authKW | 401034 | 3% | 41% | 26 |
2 | ELECTROOPTIC MEASUREMENTS | authKW | 256615 | 2% | 48% | 14 |
3 | ELECTROOPTIC PROBING | authKW | 151882 | 0% | 100% | 4 |
4 | ELECTROOPTIC SAMPLING EOS | authKW | 151882 | 0% | 100% | 4 |
5 | TERAHERTZ MEDIA SYST | address | 143114 | 1% | 54% | 7 |
6 | ROTATION MAGNETIZATION | authKW | 121504 | 0% | 80% | 4 |
7 | ELECTROOPTIC EO MEASUREMENTS | authKW | 113912 | 0% | 100% | 3 |
8 | PHOTOCONDUCTIVE MEASUREMENT | authKW | 113912 | 0% | 100% | 3 |
9 | NEAR FIELD RADIATION PATTERNS | authKW | 85432 | 0% | 75% | 3 |
10 | ULTRAFAST OPT SCI RADIAT | address | 85432 | 0% | 75% | 3 |
Web of Science journal categories |
chi_square_rank | Category | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
---|---|---|---|---|---|
1 | Engineering, Electrical & Electronic | 5644 | 49% | 0% | 403 |
2 | Optics | 4145 | 30% | 0% | 249 |
3 | Physics, Applied | 3963 | 45% | 0% | 372 |
4 | Instruments & Instrumentation | 526 | 9% | 0% | 72 |
5 | Nanoscience & Nanotechnology | 95 | 5% | 0% | 39 |
6 | Spectroscopy | 90 | 3% | 0% | 29 |
7 | Telecommunications | 86 | 3% | 0% | 28 |
8 | Engineering, General | 23 | 2% | 0% | 15 |
9 | Physics, Condensed Matter | 19 | 5% | 0% | 40 |
10 | COMPUTER APPLICATIONS & CYBERNETICS | 13 | 0% | 0% | 1 |
Address terms |
chi_square_rank | term | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
---|---|---|---|---|---|
1 | TERAHERTZ MEDIA SYST | 143114 | 1% | 54% | 7 |
2 | ULTRAFAST OPT SCI RADIAT | 85432 | 0% | 75% | 3 |
3 | BERUNI PHYS TECH | 75941 | 0% | 100% | 2 |
4 | ABT ALLGEMEINE ELEKTRO TECH MICKROELEKT | 37971 | 0% | 100% | 1 |
5 | CHINA STATE INTEGRATED OPTOELECT | 37971 | 0% | 100% | 1 |
6 | CITY ELECT ENGN | 37971 | 0% | 100% | 1 |
7 | CNRS URA 0820 | 37971 | 0% | 100% | 1 |
8 | DASSAULT ELE ON | 37971 | 0% | 100% | 1 |
9 | DETECTOR RADIOMETRY | 37971 | 0% | 100% | 1 |
10 | FG ALLGEMEINE THEORET ELEKTROTECH | 37971 | 0% | 100% | 1 |
Journals |
chi_square_rank | term | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
---|---|---|---|---|---|
1 | IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES | 9804 | 7% | 0% | 58 |
2 | APPLIED PHYSICS LETTERS | 4970 | 15% | 0% | 122 |
3 | IEEE MICROWAVE AND GUIDED WAVE LETTERS | 4501 | 1% | 1% | 10 |
4 | OPTICAL AND QUANTUM ELECTRONICS | 3945 | 3% | 1% | 21 |
5 | MICROELECTRONIC ENGINEERING | 3710 | 4% | 0% | 32 |
6 | PROCEEDINGS OF THE SOCIETY OF PHOTO-OPTICAL INSTRUMENTATION ENGINEERS | 3379 | 3% | 0% | 22 |
7 | IEICE TRANSACTIONS ON ELECTRONICS | 2998 | 3% | 0% | 22 |
8 | IEEE JOURNAL OF QUANTUM ELECTRONICS | 2729 | 3% | 0% | 25 |
9 | ELECTRONICS LETTERS | 2618 | 6% | 0% | 53 |
10 | LASER FOCUS WITH FIBEROPTIC TECHNOLOGY | 1471 | 0% | 2% | 2 |
Author Key Words |
Core articles |
The table includes core articles in the class. The following variables is taken into account for the relevance score of an article in a cluster c: (1) Number of references referring to publications in the class. (2) Share of total number of active references referring to publications in the class. (3) Age of the article. New articles get higher score than old articles. (4) Citation rate, normalized to year. |
Classes with closest relation at Level 1 |