Class information for: |
Basic class information |
Hierarchy of classes |
The table includes all classes above and classes immediately below the current class. |
Cluster id | Level | Cluster label | #P |
---|---|---|---|
1 | 4 | PHYSICS, CONDENSED MATTER//PHYSICS, APPLIED//MATERIALS SCIENCE, MULTIDISCIPLINARY | 2188495 |
378 | 3 | NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS//NUCLEAR SCIENCE & TECHNOLOGY//INSTRUMENTS & INSTRUMENTATION | 34252 |
1656 | 2 | TOF SIMS//SURFACE AND INTERFACE ANALYSIS//SIMS | 7171 |
3119 | 1 | TOF SIMS//CLUSTER SIMS//CLUSTER ION BEAM | 2091 |
Terms with highest relevance score |
rank | Category | termType | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
---|---|---|---|---|---|---|
1 | TOF SIMS | authKW | 1070549 | 15% | 22% | 317 |
2 | CLUSTER SIMS | authKW | 558005 | 2% | 97% | 38 |
3 | CLUSTER ION BEAM | authKW | 536936 | 2% | 76% | 47 |
4 | GAS CLUSTER ION BEAM | authKW | 511233 | 2% | 81% | 42 |
5 | ION BEAM ENGN EXPT | address | 492165 | 3% | 56% | 58 |
6 | MOLECULAR DEPTH PROFILING | authKW | 452125 | 1% | 100% | 30 |
7 | GCIB | authKW | 378846 | 1% | 93% | 27 |
8 | STATIC SIMS | authKW | 293013 | 2% | 56% | 35 |
9 | CLUSTER IONS | authKW | 277169 | 3% | 27% | 67 |
10 | CLUSTER BOMBARDMENT | authKW | 270150 | 1% | 81% | 22 |
Web of Science journal categories |
chi_square_rank | Category | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
---|---|---|---|---|---|
1 | Materials Science, Coatings & Films | 10522 | 16% | 0% | 343 |
2 | Chemistry, Physical | 7309 | 40% | 0% | 838 |
3 | Nuclear Science & Technology | 4383 | 14% | 0% | 290 |
4 | Instruments & Instrumentation | 4335 | 15% | 0% | 312 |
5 | Physics, Atomic, Molecular & Chemical | 4161 | 18% | 0% | 384 |
6 | Physics, Nuclear | 4113 | 13% | 0% | 281 |
7 | Chemistry, Analytical | 3870 | 19% | 0% | 407 |
8 | Physics, Applied | 2882 | 26% | 0% | 538 |
9 | Spectroscopy | 2685 | 10% | 0% | 215 |
10 | Physics, Condensed Matter | 1877 | 17% | 0% | 362 |
Address terms |
chi_square_rank | term | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
---|---|---|---|---|---|
1 | ION BEAM ENGN EXPT | 492165 | 3% | 56% | 58 |
2 | PCPM | 190988 | 2% | 34% | 37 |
3 | QUANTUM SCI ENGN | 170871 | 4% | 13% | 89 |
4 | SMOLUCHOWSKI PHYS | 160881 | 3% | 20% | 53 |
5 | ESCA SUR E ANAL BIOMED PROBLEMS | 130433 | 1% | 28% | 31 |
6 | EPSRC XPS USERS SERV NEXUS | 113966 | 1% | 69% | 11 |
7 | ELE ON OPT SALES | 105496 | 0% | 100% | 7 |
8 | ATMOSPHER SCI GLOBAL CLIMATE CHANGE | 92307 | 0% | 88% | 7 |
9 | SUR E ANAL | 91060 | 2% | 12% | 49 |
10 | CONDENSED MATTER NANOSCI BIO SOFT MATTER | 73815 | 1% | 23% | 21 |
Journals |
chi_square_rank | term | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
---|---|---|---|---|---|
1 | SURFACE AND INTERFACE ANALYSIS | 241475 | 16% | 5% | 330 |
2 | BIOINTERPHASES | 37567 | 2% | 6% | 39 |
3 | NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS | 35789 | 13% | 1% | 276 |
4 | APPLIED SURFACE SCIENCE | 33152 | 14% | 1% | 284 |
5 | ANALYTICAL CHEMISTRY | 12118 | 8% | 0% | 173 |
6 | RAPID COMMUNICATIONS IN MASS SPECTROMETRY | 9268 | 4% | 1% | 75 |
7 | JOURNAL OF THE AMERICAN SOCIETY FOR MASS SPECTROMETRY | 8080 | 2% | 1% | 51 |
8 | INTERNATIONAL JOURNAL OF MASS SPECTROMETRY | 5616 | 2% | 1% | 51 |
9 | JOURNAL OF MASS SPECTROMETRY | 1434 | 1% | 1% | 18 |
10 | JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A | 1093 | 2% | 0% | 33 |
Author Key Words |
chi_square_rank | term | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass | LCSH search | Wikipedia search |
---|---|---|---|---|---|---|---|
1 | TOF SIMS | 1070549 | 15% | 22% | 317 | Search TOF+SIMS | Search TOF+SIMS |
2 | CLUSTER SIMS | 558005 | 2% | 97% | 38 | Search CLUSTER+SIMS | Search CLUSTER+SIMS |
3 | CLUSTER ION BEAM | 536936 | 2% | 76% | 47 | Search CLUSTER+ION+BEAM | Search CLUSTER+ION+BEAM |
4 | GAS CLUSTER ION BEAM | 511233 | 2% | 81% | 42 | Search GAS+CLUSTER+ION+BEAM | Search GAS+CLUSTER+ION+BEAM |
5 | MOLECULAR DEPTH PROFILING | 452125 | 1% | 100% | 30 | Search MOLECULAR+DEPTH+PROFILING | Search MOLECULAR+DEPTH+PROFILING |
6 | GCIB | 378846 | 1% | 93% | 27 | Search GCIB | Search GCIB |
7 | STATIC SIMS | 293013 | 2% | 56% | 35 | Search STATIC+SIMS | Search STATIC+SIMS |
8 | CLUSTER IONS | 277169 | 3% | 27% | 67 | Search CLUSTER+IONS | Search CLUSTER+IONS |
9 | CLUSTER BOMBARDMENT | 270150 | 1% | 81% | 22 | Search CLUSTER+BOMBARDMENT | Search CLUSTER+BOMBARDMENT |
10 | G SIMS | 244144 | 1% | 90% | 18 | Search G+SIMS | Search G+SIMS |
Core articles |
The table includes core articles in the class. The following variables is taken into account for the relevance score of an article in a cluster c: (1) Number of references referring to publications in the class. (2) Share of total number of active references referring to publications in the class. (3) Age of the article. New articles get higher score than old articles. (4) Citation rate, normalized to year. |
Classes with closest relation at Level 1 |