Class information for:
Level 2: TOF SIMS//SURFACE AND INTERFACE ANALYSIS//SIMS

Basic class information
Bar chart of Publication_year

Last years might be incomplete

Hierarchy of classes
The table includes all classes above and classes immediately below the current class.


Cluster id Level Cluster label #P
1 4 PHYSICS, CONDENSED MATTER//PHYSICS, APPLIED//MATERIALS SCIENCE, MULTIDISCIPLINARY 2188495
378 3       NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS//NUCLEAR SCIENCE & TECHNOLOGY//INSTRUMENTS & INSTRUMENTATION 34252
1656 2             TOF SIMS//SURFACE AND INTERFACE ANALYSIS//SIMS 7171
3119 1                   TOF SIMS//CLUSTER SIMS//CLUSTER ION BEAM 2091
5373 1                   MRI MODEL//DEPTH RESOLUTION//SIMS 1663
13061 1                   RESONANCE IONIZATION MASS SPECTROMETRY//KR 85//KR 81 894
15052 1                   TIME ABERRATIONS//FOURIER TRANSFORM LASER MICROPROBE MASS SPECTROMETRY//GALDI 760
15287 1                   MAT CHARACTERIZAT PREPARAT IL//ADV ENGN MAT IL//TOF SIMS 747
19639 1                   SIMS MICROSCOPY//ION MICROSCOPY//ANALYTICAL ION MICROSCOPY 520
25366 1                   SHAVE OFF DEPTH PROFILING//SHAVE OFF//SAMPLE ROTATION SIMS 307
33528 1                   NA IMPLANTATION//NA MIGRATION//BIAS TEMPERATURE STRESS TOF SIMS 137
38818 1                   INVERSE TRANSPORT//BIOMATERIALS MEDICAL DEVICES AND ARTIFICIAL ORGANS//CHEMTECH 52

Terms with highest relevance score


rank Category termType chi_square shrOfCwithTerm shrOfTermInClass termInClass
1 TOF SIMS authKW 606361 6% 31% 442
2 SURFACE AND INTERFACE ANALYSIS journal 463433 12% 12% 847
3 SIMS authKW 403099 6% 20% 450
4 SECONDARY ION MASS SPECTROMETRY authKW 205553 3% 26% 182
5 CLUSTER SIMS authKW 162655 1% 97% 38
6 CLUSTER ION BEAM authKW 156499 1% 76% 47
7 DEPTH PROFILING authKW 155248 2% 20% 179
8 GAS CLUSTER ION BEAM authKW 149011 1% 81% 42
9 ION BEAM ENGN EXPT address 148419 1% 57% 59
10 MOLECULAR DEPTH PROFILING authKW 131793 0% 100% 30

Web of Science journal categories


chi_square_rank Category chi_square shrOfCwithTerm shrOfTermInClass termInClass
1 Materials Science, Coatings & Films 24782 14% 1% 981
2 Chemistry, Analytical 11837 18% 0% 1325
3 Spectroscopy 10359 11% 0% 779
4 Chemistry, Physical 9832 27% 0% 1901
5 Physics, Applied 8819 25% 0% 1757
6 Physics, Atomic, Molecular & Chemical 6243 13% 0% 906
7 Instruments & Instrumentation 5992 10% 0% 704
8 Nuclear Science & Technology 5295 9% 0% 614
9 Microscopy 3932 3% 1% 188
10 Physics, Nuclear 3450 7% 0% 506

Address terms


chi_square_rank term chi_square shrOfCwithTerm shrOfTermInClass termInClass
1 ION BEAM ENGN EXPT 148419 1% 57% 59
2 SCI ANAL MAT SAM 115180 1% 67% 39
3 PCPM 65033 1% 37% 40
4 MAT CHARACTERIZAT PREPARAT IL 63217 1% 40% 36
5 QUANTUM SCI ENGN 49698 1% 13% 89
6 SMOLUCHOWSKI PHYS 46836 1% 20% 53
7 ESCA SUR E ANAL BIOMED PROBLEMS 40482 0% 29% 32
8 ADV ENGN MAT IL 34163 0% 32% 24
9 EPSRC XPS USERS SERV NEXUS 33216 0% 69% 11
10 ELE ON OPT SALES 30752 0% 100% 7

Journals


chi_square_rank term chi_square shrOfCwithTerm shrOfTermInClass termInClass
1 SURFACE AND INTERFACE ANALYSIS 463433 12% 12% 847
2 APPLIED SURFACE SCIENCE 48503 9% 2% 639
3 NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS 30182 7% 1% 473
4 INTERNATIONAL JOURNAL OF MASS SPECTROMETRY 26268 3% 3% 204
5 ANALYTICAL CHEMISTRY 17788 5% 1% 391
6 FRESENIUS ZEITSCHRIFT FUR ANALYTISCHE CHEMIE 15133 1% 3% 107
7 INTERNATIONAL JOURNAL OF MASS SPECTROMETRY AND ION PROCESSES 14800 1% 5% 64
8 JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A 13649 3% 2% 213
9 BIOINTERPHASES 10899 1% 6% 39
10 MIKROCHIMICA ACTA 7231 1% 2% 70

Author Key Words


chi_square_rank term chi_square shrOfCwithTerm shrOfTermInClass termInClass LCSH search Wikipedia search
1 TOF SIMS 606361 6% 31% 442 Search TOF+SIMS Search TOF+SIMS
2 SIMS 403099 6% 20% 450 Search SIMS Search SIMS
3 SECONDARY ION MASS SPECTROMETRY 205553 3% 26% 182 Search SECONDARY+ION+MASS+SPECTROMETRY Search SECONDARY+ION+MASS+SPECTROMETRY
4 CLUSTER SIMS 162655 1% 97% 38 Search CLUSTER+SIMS Search CLUSTER+SIMS
5 CLUSTER ION BEAM 156499 1% 76% 47 Search CLUSTER+ION+BEAM Search CLUSTER+ION+BEAM
6 DEPTH PROFILING 155248 2% 20% 179 Search DEPTH+PROFILING Search DEPTH+PROFILING
7 GAS CLUSTER ION BEAM 149011 1% 81% 42 Search GAS+CLUSTER+ION+BEAM Search GAS+CLUSTER+ION+BEAM
8 MOLECULAR DEPTH PROFILING 131793 0% 100% 30 Search MOLECULAR+DEPTH+PROFILING Search MOLECULAR+DEPTH+PROFILING
9 DEPTH RESOLUTION 124737 1% 42% 67 Search DEPTH+RESOLUTION Search DEPTH+RESOLUTION
10 STATIC SIMS 117190 1% 65% 41 Search STATIC+SIMS Search STATIC+SIMS

Core articles
The table includes core articles in the class. The following variables is taken into account for the relevance score of an article in a cluster c:
(1) Number of references referring to publications in the class.
(2) Share of total number of active references referring to publications in the class.
(3) Age of the article. New articles get higher score than old articles.
(4) Citation rate, normalized to year.

Classes with closest relation at Level 2


rank cluster_id2 link
1 3133 NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS//ION PHOTON EMISSION//SPUTTERING
2 3509 ELECTRON BEAM ANNEALING//ION SPUTTERING//NANORIPPLES
3 2208 SWIFT HEAVY IONS//ION TRACKS//THERMAL SPIKE
4 2356 SURFACE AND INTERFACE ANALYSIS//JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA//SURFACE EXCITATION
5 2946 ACCELERATOR MASS SPECTROMETRY//RADIOCARBON//AMS
6 193 JOURNAL OF THE AMERICAN SOCIETY FOR MASS SPECTROMETRY//RAPID COMMUNICATIONS IN MASS SPECTROMETRY//INTERNATIONAL JOURNAL OF MASS SPECTROMETRY
7 133 JOURNAL OF ANALYTICAL ATOMIC SPECTROMETRY//SPECTROCHIMICA ACTA PART B-ATOMIC SPECTROSCOPY//SPECTROSCOPY
8 1481 TRANSIENT ENHANCED DIFFUSION//NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS//ION IMPLANTATION
9 1299 NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS//STOPPING POWER//HIGHLY CHARGED IONS
10 1521 SURFACE DIFFUSION//SURFACE INDUCED DISSOCIATION//LIQUID SUBSTRATE

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