Class information for: |
Basic class information |
Hierarchy of classes |
The table includes all classes above and classes immediately below the current class. |
| Cluster id | Level | Cluster label | #P |
|---|---|---|---|
| 1 | 4 | PHYSICS, CONDENSED MATTER//PHYSICS, APPLIED//MATERIALS SCIENCE, MULTIDISCIPLINARY | 2188495 |
| 13 | 3 | PHYSICS, APPLIED//IEEE TRANSACTIONS ON ELECTRON DEVICES//SILICON | 136516 |
| 1185 | 2 | OXYGEN PRECIPITATION//CZOCHRALSKI SILICON//THERMAL DONORS | 9644 |
| 17754 | 1 | DLTS RESOLUTION//NONCONTACT C V//EMISSION RATE SPECTRUM | 612 |
Terms with highest relevance score |
| rank | Category | termType | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
|---|---|---|---|---|---|---|
| 1 | DLTS RESOLUTION | authKW | 102994 | 0% | 100% | 2 |
| 2 | NONCONTACT C V | authKW | 92692 | 0% | 60% | 3 |
| 3 | EMISSION RATE SPECTRUM | authKW | 77242 | 0% | 50% | 3 |
| 4 | CAPACITANCE TRANSIENTS | authKW | 66207 | 0% | 43% | 3 |
| 5 | ALUMINIUM FLORIDE | authKW | 51497 | 0% | 100% | 1 |
| 6 | ASSOC MAT SENSORS | address | 51497 | 0% | 100% | 1 |
| 7 | BARE SILICON WAFER | authKW | 51497 | 0% | 100% | 1 |
| 8 | CAPTURE CROSS SECTION AND CONDUCTANCE MEASUREMENTS | authKW | 51497 | 0% | 100% | 1 |
| 9 | CHARGE POTENTIAL FEEDBACK EFFECT | authKW | 51497 | 0% | 100% | 1 |
| 10 | CHIMNEY CVD REACTOR | authKW | 51497 | 0% | 100% | 1 |
Web of Science journal categories |
| chi_square_rank | Category | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
|---|---|---|---|---|---|
| 1 | Physics, Applied | 6522 | 65% | 0% | 399 |
| 2 | Physics, Condensed Matter | 2739 | 36% | 0% | 218 |
| 3 | Instruments & Instrumentation | 738 | 12% | 0% | 71 |
| 4 | Engineering, Electrical & Electronic | 540 | 19% | 0% | 119 |
| 5 | Materials Science, Multidisciplinary | 387 | 20% | 0% | 125 |
| 6 | Materials Science, Coatings & Films | 116 | 4% | 0% | 22 |
| 7 | Physics, Multidisciplinary | 39 | 5% | 0% | 33 |
| 8 | Engineering, General | 38 | 2% | 0% | 15 |
| 9 | Nanoscience & Nanotechnology | 10 | 2% | 0% | 15 |
| 10 | Crystallography | 3 | 1% | 0% | 8 |
Address terms |
| chi_square_rank | term | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
|---|---|---|---|---|---|
| 1 | ASSOC MAT SENSORS | 51497 | 0% | 100% | 1 |
| 2 | EA2654 | 51497 | 0% | 100% | 1 |
| 3 | ELE OENGN MICROELE | 51497 | 0% | 100% | 1 |
| 4 | ELE PHYS INTER ES | 51497 | 0% | 100% | 1 |
| 5 | EMULS POLYMERS SHERMAN FAIRCHILD 161 | 51497 | 0% | 100% | 1 |
| 6 | ETUDES SUR ES INTER ES COMPOSANTS CNRS | 51497 | 0% | 100% | 1 |
| 7 | LASMEA CNRS URA 1793 | 51497 | 0% | 100% | 1 |
| 8 | SCI TECHNOL ELECT MAT | 51497 | 0% | 100% | 1 |
| 9 | URA 787 | 51497 | 0% | 100% | 1 |
| 10 | EA2654IUT | 25747 | 0% | 50% | 1 |
Journals |
| chi_square_rank | term | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
|---|---|---|---|---|---|
| 1 | SOVIET PHYSICS SEMICONDUCTORS-USSR | 15485 | 7% | 1% | 41 |
| 2 | SOLID-STATE ELECTRONICS | 8634 | 7% | 0% | 41 |
| 3 | PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE | 7223 | 9% | 0% | 54 |
| 4 | JOURNAL OF APPLIED PHYSICS | 5646 | 18% | 0% | 109 |
| 5 | SEMICONDUCTOR SCIENCE AND TECHNOLOGY | 2251 | 3% | 0% | 19 |
| 6 | REVUE DE PHYSIQUE APPLIQUEE | 1904 | 1% | 1% | 7 |
| 7 | REVIEW OF SCIENTIFIC INSTRUMENTS | 1892 | 6% | 0% | 34 |
| 8 | SEMICONDUCTORS | 1430 | 2% | 0% | 14 |
| 9 | JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS | 1257 | 5% | 0% | 28 |
| 10 | JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS | 1089 | 1% | 0% | 7 |
Author Key Words |
Core articles |
The table includes core articles in the class. The following variables is taken into account for the relevance score of an article in a cluster c: (1) Number of references referring to publications in the class. (2) Share of total number of active references referring to publications in the class. (3) Age of the article. New articles get higher score than old articles. (4) Citation rate, normalized to year. |
Classes with closest relation at Level 1 |