Class information for:
Level 1: AC SURFACE PHOTOVOLTAGE//SCANNING PHOTON MICROSCOPE//VIBRATING CAPACITOR

Basic class information

Bar chart of Publication_year

Last years might be incomplete

Hierarchy of classes

The table includes all classes above and classes immediately below the current class.



Cluster id Level Cluster label #P
1 4 PHYSICS, CONDENSED MATTER//PHYSICS, APPLIED//MATERIALS SCIENCE, MULTIDISCIPLINARY 2188495
13 3       PHYSICS, APPLIED//IEEE TRANSACTIONS ON ELECTRON DEVICES//SILICON 136516
3569 2             AC SURFACE PHOTOVOLTAGE//ELECTRON WORK FUNCTION//REGIONAL DENSITY FUNCTIONAL THEORY 1429
19104 1                   AC SURFACE PHOTOVOLTAGE//SCANNING PHOTON MICROSCOPE//VIBRATING CAPACITOR 544

Terms with highest relevance score



rank Category termType chi_square shrOfCwithTerm shrOfTermInClass termInClass
1 AC SURFACE PHOTOVOLTAGE authKW 757005 3% 93% 14
2 SCANNING PHOTON MICROSCOPE authKW 354845 1% 88% 7
3 VIBRATING CAPACITOR authKW 236559 1% 58% 7
4 RCA RINSE authKW 231737 1% 100% 4
5 SURFACE PHOTOVOLTAGE authKW 208510 6% 12% 30
6 OXIDE CHARGE authKW 195798 2% 26% 13
7 AC PHOTOVOLTAIC METHOD authKW 173803 1% 100% 3
8 RCA SOLUTION authKW 173803 1% 100% 3
9 VOLUME LIFETIME authKW 173803 1% 100% 3
10 SURFACE VOLTAGE authKW 148967 1% 43% 6

Web of Science journal categories



chi_square_rank Category chi_square shrOfCwithTerm shrOfTermInClass termInClass
1 Physics, Applied 3503 51% 0% 280
2 Physics, Condensed Matter 2387 35% 0% 192
3 Materials Science, Coatings & Films 405 7% 0% 36
4 Materials Science, Multidisciplinary 392 22% 0% 117
5 Engineering, Electrical & Electronic 192 13% 0% 73
6 Chemistry, Physical 72 11% 0% 59
7 Physics, Multidisciplinary 58 6% 0% 35
8 Instruments & Instrumentation 43 4% 0% 20
9 Nanoscience & Nanotechnology 42 4% 0% 22
10 Electrochemistry 27 3% 0% 14

Address terms



chi_square_rank term chi_square shrOfCwithTerm shrOfTermInClass termInClass
1 STATE METASTABLE MAT MANU TURE TECHNOL 130350 1% 75% 3
2 METASTABLE MAT MFG TECHNOL SCI 115868 0% 100% 2
3 ADV STUDIES SNECTAR 57934 0% 100% 1
4 ANGEW PHOTOPHY 57934 0% 100% 1
5 EPSRC SEMICONDUCT CENT IL 3 5 57934 0% 100% 1
6 EUROPEAN ADV STUDIES 57934 0% 100% 1
7 GAL EL 57934 0% 100% 1
8 METASTABLE MAT MANU TURE TECHNOL 57934 0% 100% 1
9 METASTABLE MAT MANU TURE TECHNOL SCI 57934 0% 100% 1
10 MICROCONTAMINAT ANAL 57934 0% 100% 1

Journals



chi_square_rank term chi_square shrOfCwithTerm shrOfTermInClass termInClass
1 SOVIET PHYSICS SEMICONDUCTORS-USSR 4553 4% 0% 21
2 SEMICONDUCTORS 4007 4% 0% 22
3 JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS 3560 8% 0% 44
4 SOLID-STATE ELECTRONICS 2293 4% 0% 20
5 SEMICONDUCTOR SCIENCE AND TECHNOLOGY 2028 3% 0% 17
6 SOVIET MICROELECTRONICS 1738 1% 1% 3
7 TECHNICAL PHYSICS LETTERS 1232 2% 0% 12
8 JOURNAL OF APPLIED PHYSICS 768 7% 0% 39
9 JOURNAL OF SURFACE INVESTIGATION 698 1% 0% 4
10 MATERIALS SCIENCE AND ENGINEERING B-SOLID STATE MATERIALS FOR ADVANCED TECHNOLOGY 623 2% 0% 9

Author Key Words



chi_square_rank term chi_square shrOfCwithTerm shrOfTermInClass termInClass LCSH search Wikipedia search
1 AC SURFACE PHOTOVOLTAGE 757005 3% 93% 14 Search AC+SURFACE+PHOTOVOLTAGE Search AC+SURFACE+PHOTOVOLTAGE
2 SCANNING PHOTON MICROSCOPE 354845 1% 88% 7 Search SCANNING+PHOTON+MICROSCOPE Search SCANNING+PHOTON+MICROSCOPE
3 VIBRATING CAPACITOR 236559 1% 58% 7 Search VIBRATING+CAPACITOR Search VIBRATING+CAPACITOR
4 RCA RINSE 231737 1% 100% 4 Search RCA+RINSE Search RCA+RINSE
5 SURFACE PHOTOVOLTAGE 208510 6% 12% 30 Search SURFACE+PHOTOVOLTAGE Search SURFACE+PHOTOVOLTAGE
6 OXIDE CHARGE 195798 2% 26% 13 Search OXIDE+CHARGE Search OXIDE+CHARGE
7 AC PHOTOVOLTAIC METHOD 173803 1% 100% 3 Search AC+PHOTOVOLTAIC+METHOD Search AC+PHOTOVOLTAIC+METHOD
8 RCA SOLUTION 173803 1% 100% 3 Search RCA+SOLUTION Search RCA+SOLUTION
9 VOLUME LIFETIME 173803 1% 100% 3 Search VOLUME+LIFETIME Search VOLUME+LIFETIME
10 SURFACE VOLTAGE 148967 1% 43% 6 Search SURFACE+VOLTAGE Search SURFACE+VOLTAGE

Core articles

The table includes core articles in the class. The following variables is taken into account for the relevance score of an article in a cluster c:
(1) Number of references referring to publications in the class.
(2) Share of total number of active references referring to publications in the class.
(3) Age of the article. New articles get higher score than old articles.
(4) Citation rate, normalized to year.

Classes with closest relation at Level 1



rank cluster_id2 link
1 24831 LIQUID CRYSTAL PROPERTY//PORPHYRIN LIQUID CRYSTAL//SURFACE PHOTOVOLTAGE SPECTRUM
2 23725 ELECTRON WORK FUNCTION//AERONAUT TESTING EVALUAT//FOWLERS METHODS
3 17550 PHOTOCARRIER RADIOMETRY//CADIFT//PHOTOTHERMAL OPTOELECT DIAGNOST S
4 23836 PN JUNCTION LEAKAGE//IRRADIATED P N JUNCTION LEAKAGE//JUNCTION SHAPE
5 11596 PHOTOREFLECTANCE//FRANZ KELDYSH OSCILLATIONS//NEW YORK STATE ADV TECHNOL ULTRAFAST PHOTON M
6 3643 GETTERING//DLTS//SI AU
7 17764 DYE SENSITIZED//IMPS IMVS//NANOCRYSTALLINE CDSE ELECTRODES
8 7741 HYDROGEN TERMINATION//NATIVE OXIDE//SHIZUOKA TORY
9 34428 AL CR FILM//CARBONIC STRUCTURES//EDS SPECTRA
10 11099 SOLAR CELLS//SOLID-STATE ELECTRONICS//HIGH LOW JUNCTION

Go to start page