Class information for: |
Basic class information |
Hierarchy of classes |
The table includes all classes above and classes immediately below the current class. |
Cluster id | Level | Cluster label | #P |
---|---|---|---|
1 | 4 | PHYSICS, CONDENSED MATTER//PHYSICS, APPLIED//MATERIALS SCIENCE, MULTIDISCIPLINARY | 2188495 |
13 | 3 | PHYSICS, APPLIED//IEEE TRANSACTIONS ON ELECTRON DEVICES//SILICON | 136516 |
3569 | 2 | AC SURFACE PHOTOVOLTAGE//ELECTRON WORK FUNCTION//REGIONAL DENSITY FUNCTIONAL THEORY | 1429 |
19104 | 1 | AC SURFACE PHOTOVOLTAGE//SCANNING PHOTON MICROSCOPE//VIBRATING CAPACITOR | 544 |
Terms with highest relevance score |
rank | Category | termType | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
---|---|---|---|---|---|---|
1 | AC SURFACE PHOTOVOLTAGE | authKW | 757005 | 3% | 93% | 14 |
2 | SCANNING PHOTON MICROSCOPE | authKW | 354845 | 1% | 88% | 7 |
3 | VIBRATING CAPACITOR | authKW | 236559 | 1% | 58% | 7 |
4 | RCA RINSE | authKW | 231737 | 1% | 100% | 4 |
5 | SURFACE PHOTOVOLTAGE | authKW | 208510 | 6% | 12% | 30 |
6 | OXIDE CHARGE | authKW | 195798 | 2% | 26% | 13 |
7 | AC PHOTOVOLTAIC METHOD | authKW | 173803 | 1% | 100% | 3 |
8 | RCA SOLUTION | authKW | 173803 | 1% | 100% | 3 |
9 | VOLUME LIFETIME | authKW | 173803 | 1% | 100% | 3 |
10 | SURFACE VOLTAGE | authKW | 148967 | 1% | 43% | 6 |
Web of Science journal categories |
chi_square_rank | Category | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
---|---|---|---|---|---|
1 | Physics, Applied | 3503 | 51% | 0% | 280 |
2 | Physics, Condensed Matter | 2387 | 35% | 0% | 192 |
3 | Materials Science, Coatings & Films | 405 | 7% | 0% | 36 |
4 | Materials Science, Multidisciplinary | 392 | 22% | 0% | 117 |
5 | Engineering, Electrical & Electronic | 192 | 13% | 0% | 73 |
6 | Chemistry, Physical | 72 | 11% | 0% | 59 |
7 | Physics, Multidisciplinary | 58 | 6% | 0% | 35 |
8 | Instruments & Instrumentation | 43 | 4% | 0% | 20 |
9 | Nanoscience & Nanotechnology | 42 | 4% | 0% | 22 |
10 | Electrochemistry | 27 | 3% | 0% | 14 |
Address terms |
chi_square_rank | term | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
---|---|---|---|---|---|
1 | STATE METASTABLE MAT MANU TURE TECHNOL | 130350 | 1% | 75% | 3 |
2 | METASTABLE MAT MFG TECHNOL SCI | 115868 | 0% | 100% | 2 |
3 | ADV STUDIES SNECTAR | 57934 | 0% | 100% | 1 |
4 | ANGEW PHOTOPHY | 57934 | 0% | 100% | 1 |
5 | EPSRC SEMICONDUCT CENT IL 3 5 | 57934 | 0% | 100% | 1 |
6 | EUROPEAN ADV STUDIES | 57934 | 0% | 100% | 1 |
7 | GAL EL | 57934 | 0% | 100% | 1 |
8 | METASTABLE MAT MANU TURE TECHNOL | 57934 | 0% | 100% | 1 |
9 | METASTABLE MAT MANU TURE TECHNOL SCI | 57934 | 0% | 100% | 1 |
10 | MICROCONTAMINAT ANAL | 57934 | 0% | 100% | 1 |
Journals |
chi_square_rank | term | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
---|---|---|---|---|---|
1 | SOVIET PHYSICS SEMICONDUCTORS-USSR | 4553 | 4% | 0% | 21 |
2 | SEMICONDUCTORS | 4007 | 4% | 0% | 22 |
3 | JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS | 3560 | 8% | 0% | 44 |
4 | SOLID-STATE ELECTRONICS | 2293 | 4% | 0% | 20 |
5 | SEMICONDUCTOR SCIENCE AND TECHNOLOGY | 2028 | 3% | 0% | 17 |
6 | SOVIET MICROELECTRONICS | 1738 | 1% | 1% | 3 |
7 | TECHNICAL PHYSICS LETTERS | 1232 | 2% | 0% | 12 |
8 | JOURNAL OF APPLIED PHYSICS | 768 | 7% | 0% | 39 |
9 | JOURNAL OF SURFACE INVESTIGATION | 698 | 1% | 0% | 4 |
10 | MATERIALS SCIENCE AND ENGINEERING B-SOLID STATE MATERIALS FOR ADVANCED TECHNOLOGY | 623 | 2% | 0% | 9 |
Author Key Words |
chi_square_rank | term | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass | LCSH search | Wikipedia search |
---|---|---|---|---|---|---|---|
1 | AC SURFACE PHOTOVOLTAGE | 757005 | 3% | 93% | 14 | Search AC+SURFACE+PHOTOVOLTAGE | Search AC+SURFACE+PHOTOVOLTAGE |
2 | SCANNING PHOTON MICROSCOPE | 354845 | 1% | 88% | 7 | Search SCANNING+PHOTON+MICROSCOPE | Search SCANNING+PHOTON+MICROSCOPE |
3 | VIBRATING CAPACITOR | 236559 | 1% | 58% | 7 | Search VIBRATING+CAPACITOR | Search VIBRATING+CAPACITOR |
4 | RCA RINSE | 231737 | 1% | 100% | 4 | Search RCA+RINSE | Search RCA+RINSE |
5 | SURFACE PHOTOVOLTAGE | 208510 | 6% | 12% | 30 | Search SURFACE+PHOTOVOLTAGE | Search SURFACE+PHOTOVOLTAGE |
6 | OXIDE CHARGE | 195798 | 2% | 26% | 13 | Search OXIDE+CHARGE | Search OXIDE+CHARGE |
7 | AC PHOTOVOLTAIC METHOD | 173803 | 1% | 100% | 3 | Search AC+PHOTOVOLTAIC+METHOD | Search AC+PHOTOVOLTAIC+METHOD |
8 | RCA SOLUTION | 173803 | 1% | 100% | 3 | Search RCA+SOLUTION | Search RCA+SOLUTION |
9 | VOLUME LIFETIME | 173803 | 1% | 100% | 3 | Search VOLUME+LIFETIME | Search VOLUME+LIFETIME |
10 | SURFACE VOLTAGE | 148967 | 1% | 43% | 6 | Search SURFACE+VOLTAGE | Search SURFACE+VOLTAGE |
Core articles |
The table includes core articles in the class. The following variables is taken into account for the relevance score of an article in a cluster c: (1) Number of references referring to publications in the class. (2) Share of total number of active references referring to publications in the class. (3) Age of the article. New articles get higher score than old articles. (4) Citation rate, normalized to year. |
Classes with closest relation at Level 1 |