Class information for: |
Basic class information |
Hierarchy of classes |
The table includes all classes above and classes immediately below the current class. |
| Cluster id | Level | Cluster label | #P |
|---|---|---|---|
| 1 | 4 | PHYSICS, CONDENSED MATTER//PHYSICS, APPLIED//MATERIALS SCIENCE, MULTIDISCIPLINARY | 2188495 |
| 519 | 3 | TERAHERTZ//TERAHERTZ TIME DOMAIN SPECTROSCOPY//TERAHERTZ SPECTROSCOPY | 21306 |
| 1536 | 2 | PHOTODIODE//PHOTODETECTORS//ENGINEERING, ELECTRICAL & ELECTRONIC | 7706 |
| 21305 | 1 | GATE LAG//FUNCT ELEMENTS CONTROL SYST//GAAS MESFET | 448 |
Terms with highest relevance score |
| rank | Category | termType | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
|---|---|---|---|---|---|---|
| 1 | GATE LAG | authKW | 315255 | 2% | 41% | 11 |
| 2 | FUNCT ELEMENTS CONTROL SYST | address | 250121 | 2% | 44% | 8 |
| 3 | GAAS MESFET | authKW | 213380 | 4% | 16% | 19 |
| 4 | P SI P AND N SI N DIODES | authKW | 211047 | 1% | 100% | 3 |
| 5 | TRANSCONDUCTANCE DISPERSION | authKW | 211047 | 1% | 100% | 3 |
| 6 | CHANNEL SUBSTRATE INTERFACE | authKW | 140698 | 0% | 100% | 2 |
| 7 | CHANNEL SUBSTRATE JUNCTION | authKW | 140698 | 0% | 100% | 2 |
| 8 | EXTRINSIC ILLUMINATION | authKW | 140698 | 0% | 100% | 2 |
| 9 | GAAS EPITAXIAL STRUCTURE | authKW | 140698 | 0% | 100% | 2 |
| 10 | SIDEGATING BIAS | authKW | 140698 | 0% | 100% | 2 |
Web of Science journal categories |
| chi_square_rank | Category | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
|---|---|---|---|---|---|
| 1 | Engineering, Electrical & Electronic | 5557 | 65% | 0% | 289 |
| 2 | Physics, Applied | 2950 | 52% | 0% | 233 |
| 3 | Physics, Condensed Matter | 926 | 25% | 0% | 112 |
| 4 | Nuclear Science & Technology | 270 | 8% | 0% | 35 |
| 5 | Nanoscience & Nanotechnology | 34 | 4% | 0% | 18 |
| 6 | Materials Science, Multidisciplinary | 24 | 9% | 0% | 40 |
| 7 | Physics, Multidisciplinary | 24 | 5% | 0% | 23 |
| 8 | Instruments & Instrumentation | 18 | 3% | 0% | 13 |
| 9 | Computer Science, Hardware & Architecture | 9 | 1% | 0% | 5 |
| 10 | Telecommunications | 8 | 2% | 0% | 8 |
Address terms |
| chi_square_rank | term | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
|---|---|---|---|---|---|
| 1 | FUNCT ELEMENTS CONTROL SYST | 250121 | 2% | 44% | 8 |
| 2 | AEROSP SYST INFR AIRPORTS | 70349 | 0% | 100% | 1 |
| 3 | ENGN PLICAT SPECIF INTEGRATED CIRC | 70349 | 0% | 100% | 1 |
| 4 | FUNCT ORIENTED ELE | 70349 | 0% | 100% | 1 |
| 5 | GRP ETUDE SYST TELECOMMUN ENSIL | 70349 | 0% | 100% | 1 |
| 6 | NANOFABRICAT NOVEL DEVICES INTEGRATED | 70349 | 0% | 100% | 1 |
| 7 | PROD COMPLEX ELE ON TECHNOL | 70349 | 0% | 100% | 1 |
| 8 | PULSE RADIAT IL | 70349 | 0% | 100% | 1 |
| 9 | ULTRA HIGH SPEED DEVICE | 70349 | 0% | 100% | 1 |
| 10 | UNITE MODENA | 70349 | 0% | 100% | 1 |
Journals |
| chi_square_rank | term | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
|---|---|---|---|---|---|
| 1 | IEEE TRANSACTIONS ON ELECTRON DEVICES | 20702 | 15% | 0% | 68 |
| 2 | SOLID-STATE ELECTRONICS | 19789 | 12% | 1% | 53 |
| 3 | ELECTRON DEVICE LETTERS | 8402 | 1% | 2% | 6 |
| 4 | ACTA ELECTRONICA | 5112 | 0% | 4% | 2 |
| 5 | IEEE TRANSACTIONS ON NUCLEAR SCIENCE | 4502 | 7% | 0% | 33 |
| 6 | SOVIET MICROELECTRONICS | 3757 | 1% | 1% | 4 |
| 7 | IEEE ELECTRON DEVICE LETTERS | 3313 | 5% | 0% | 21 |
| 8 | SEMICONDUCTOR SCIENCE AND TECHNOLOGY | 1438 | 3% | 0% | 13 |
| 9 | SOVIET PHYSICS SEMICONDUCTORS-USSR | 1245 | 2% | 0% | 10 |
| 10 | MICROELECTRONICS RELIABILITY | 758 | 2% | 0% | 9 |
Author Key Words |
Core articles |
The table includes core articles in the class. The following variables is taken into account for the relevance score of an article in a cluster c: (1) Number of references referring to publications in the class. (2) Share of total number of active references referring to publications in the class. (3) Age of the article. New articles get higher score than old articles. (4) Citation rate, normalized to year. |
Classes with closest relation at Level 1 |