Class information for: |
Basic class information |
Hierarchy of classes |
The table includes all classes above and classes immediately below the current class. |
Cluster id | Level | Cluster label | #P |
---|---|---|---|
8 | 4 | POLYMER SCIENCE//CHEMISTRY, PHYSICAL//MATERIALS SCIENCE, MULTIDISCIPLINARY | 1554940 |
506 | 3 | LASER INDUCED BREAKDOWN SPECTROSCOPY//LIBS//LASER ABLATION | 22460 |
508 | 2 | LASER CUTTING//FEMTOSECOND LASER//LASER CLEANING | 15709 |
21873 | 1 | LIBWE//LASER ETCHING//LASER INDUCED BACKSIDE WET ETCHING | 425 |
Terms with highest relevance score |
rank | Category | termType | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
---|---|---|---|---|---|---|
1 | LIBWE | authKW | 968974 | 3% | 93% | 14 |
2 | LASER ETCHING | authKW | 460575 | 5% | 30% | 21 |
3 | LASER INDUCED BACKSIDE WET ETCHING | authKW | 444938 | 1% | 100% | 6 |
4 | LIBDE | authKW | 370781 | 1% | 100% | 5 |
5 | FUSED SILICA | authKW | 329512 | 9% | 11% | 40 |
6 | BACKSIDE ETCHING | authKW | 308983 | 1% | 83% | 5 |
7 | VISIBLE LIBWE | authKW | 296625 | 1% | 100% | 4 |
8 | TWIN LIBWE | authKW | 222469 | 1% | 100% | 3 |
9 | DIELECTRIC MASK | authKW | 169497 | 1% | 57% | 4 |
10 | PLICAT PLASMA PHOTON | address | 166844 | 1% | 38% | 6 |
Web of Science journal categories |
chi_square_rank | Category | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
---|---|---|---|---|---|
1 | Physics, Applied | 5508 | 72% | 0% | 304 |
2 | Materials Science, Coatings & Films | 2839 | 19% | 0% | 80 |
3 | Optics | 1522 | 26% | 0% | 109 |
4 | Materials Science, Multidisciplinary | 1430 | 42% | 0% | 177 |
5 | Physics, Condensed Matter | 684 | 22% | 0% | 95 |
6 | Nanoscience & Nanotechnology | 619 | 14% | 0% | 59 |
7 | Chemistry, Physical | 332 | 21% | 0% | 89 |
8 | Materials Science, Ceramics | 110 | 4% | 0% | 15 |
9 | Engineering, Electrical & Electronic | 31 | 8% | 0% | 33 |
10 | Instruments & Instrumentation | 30 | 4% | 0% | 15 |
Address terms |
chi_square_rank | term | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
---|---|---|---|---|---|
1 | PLICAT PLASMA PHOTON | 166844 | 1% | 38% | 6 |
2 | GRP LASER PHYS | 121930 | 4% | 9% | 18 |
3 | ION BEAM TECH | 98874 | 0% | 67% | 2 |
4 | OPT QUANTUM ELECT | 95855 | 7% | 4% | 31 |
5 | PHOTON NANO PLICAT | 95340 | 1% | 43% | 3 |
6 | AGC FLAT GLASS RUSSIA | 74156 | 0% | 100% | 1 |
7 | BEREICH PLASMABASIERTE EUV STRAHLUNGSQUELLEN NI | 74156 | 0% | 100% | 1 |
8 | CHIM INORGAN CVD | 74156 | 0% | 100% | 1 |
9 | ENVIRONM PHYS LASER SPECTOSCOPY | 74156 | 0% | 100% | 1 |
10 | INFORMAT TECHNOL ELECT ENGN MECHATRON | 74156 | 0% | 100% | 1 |
Journals |
chi_square_rank | term | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
---|---|---|---|---|---|
1 | JOURNAL OF LASER MICRO NANOENGINEERING | 143769 | 8% | 6% | 34 |
2 | APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING | 30878 | 18% | 1% | 77 |
3 | APPLIED SURFACE SCIENCE | 11115 | 17% | 0% | 74 |
4 | JOURNAL OF LASER APPLICATIONS | 3587 | 2% | 1% | 7 |
5 | GLASS AND CERAMICS | 1963 | 1% | 0% | 6 |
6 | OPTICS AND LASERS IN ENGINEERING | 1682 | 2% | 0% | 9 |
7 | GLASTECHNISCHE BERICHTE-GLASS SCIENCE AND TECHNOLOGY | 1242 | 1% | 1% | 3 |
8 | JOURNAL OF MICROMECHANICS AND MICROENGINEERING | 626 | 2% | 0% | 7 |
9 | JOURNAL OF THE EUROPEAN OPTICAL SOCIETY-RAPID PUBLICATIONS | 507 | 0% | 0% | 2 |
10 | JOURNAL OF PHOTOCHEMISTRY AND PHOTOBIOLOGY A-CHEMISTRY | 309 | 1% | 0% | 6 |
Author Key Words |
chi_square_rank | term | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass | LCSH search | Wikipedia search |
---|---|---|---|---|---|---|---|
1 | LIBWE | 968974 | 3% | 93% | 14 | Search LIBWE | Search LIBWE |
2 | LASER ETCHING | 460575 | 5% | 30% | 21 | Search LASER+ETCHING | Search LASER+ETCHING |
3 | LASER INDUCED BACKSIDE WET ETCHING | 444938 | 1% | 100% | 6 | Search LASER+INDUCED+BACKSIDE+WET+ETCHING | Search LASER+INDUCED+BACKSIDE+WET+ETCHING |
4 | LIBDE | 370781 | 1% | 100% | 5 | Search LIBDE | Search LIBDE |
5 | FUSED SILICA | 329512 | 9% | 11% | 40 | Search FUSED+SILICA | Search FUSED+SILICA |
6 | BACKSIDE ETCHING | 308983 | 1% | 83% | 5 | Search BACKSIDE+ETCHING | Search BACKSIDE+ETCHING |
7 | VISIBLE LIBWE | 296625 | 1% | 100% | 4 | Search VISIBLE+LIBWE | Search VISIBLE+LIBWE |
8 | TWIN LIBWE | 222469 | 1% | 100% | 3 | Search TWIN+LIBWE | Search TWIN+LIBWE |
9 | DIELECTRIC MASK | 169497 | 1% | 57% | 4 | Search DIELECTRIC+MASK | Search DIELECTRIC+MASK |
10 | DIODE PUMPED SOLID STATE UV LASER | 148313 | 0% | 100% | 2 | Search DIODE+PUMPED+SOLID+STATE+UV+LASER | Search DIODE+PUMPED+SOLID+STATE+UV+LASER |
Core articles |
The table includes core articles in the class. The following variables is taken into account for the relevance score of an article in a cluster c: (1) Number of references referring to publications in the class. (2) Share of total number of active references referring to publications in the class. (3) Age of the article. New articles get higher score than old articles. (4) Citation rate, normalized to year. |
Classes with closest relation at Level 1 |