Class information for: |
Basic class information |
Hierarchy of classes |
The table includes all classes above and classes immediately below the current class. |
Terms with highest relevance score |
rank | Category | termType | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
---|---|---|---|---|---|---|
1 | CHEMICAL MECHANICAL POLISHING | authKW | 3773225 | 17% | 71% | 383 |
2 | CMP | authKW | 1803395 | 10% | 55% | 237 |
3 | CHEMICAL MECHANICAL PLANARIZATION | authKW | 1209498 | 5% | 82% | 107 |
4 | CHEMICAL MECHANICAL POLISHING CMP | authKW | 1187050 | 6% | 66% | 129 |
5 | CHEMICAL MECHANICAL PLANARIZATION CMP | authKW | 584849 | 2% | 78% | 54 |
6 | POLISHING PAD | authKW | 332535 | 1% | 83% | 29 |
7 | DISHING | authKW | 292351 | 1% | 81% | 26 |
8 | NANO SOI PROC | address | 251159 | 1% | 55% | 33 |
9 | REMOVAL RATE | authKW | 248246 | 3% | 30% | 59 |
10 | PLANARIZATION | authKW | 238473 | 3% | 28% | 62 |
Web of Science journal categories |
chi_square_rank | Category | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
---|---|---|---|---|---|
1 | Materials Science, Coatings & Films | 26014 | 24% | 0% | 557 |
2 | Engineering, Manufacturing | 12798 | 13% | 0% | 302 |
3 | Electrochemistry | 8940 | 17% | 0% | 394 |
4 | Physics, Applied | 8302 | 40% | 0% | 902 |
5 | Materials Science, Multidisciplinary | 3813 | 31% | 0% | 697 |
6 | Engineering, Mechanical | 2243 | 11% | 0% | 248 |
7 | Nanoscience & Nanotechnology | 1910 | 11% | 0% | 246 |
8 | Engineering, Electrical & Electronic | 1855 | 19% | 0% | 428 |
9 | Physics, Condensed Matter | 1830 | 17% | 0% | 376 |
10 | Engineering, Industrial | 543 | 3% | 0% | 67 |
Address terms |
chi_square_rank | term | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
---|---|---|---|---|---|
1 | NANO SOI PROC | 251159 | 1% | 55% | 33 |
2 | FAB | 173888 | 1% | 74% | 17 |
3 | SHENZHEN MICRO NANO MFG | 150691 | 1% | 78% | 14 |
4 | ADV MAT PROC | 121164 | 5% | 8% | 113 |
5 | ENERGY OURCES TECHNOL | 110693 | 1% | 40% | 20 |
6 | STATE TRIBOL | 78008 | 5% | 5% | 105 |
7 | ADV SEMICOND MAT DEVICE DEV | 72797 | 0% | 48% | 11 |
8 | GP TECHNOL | 69198 | 0% | 100% | 5 |
9 | ADV SEMICOND MAT DEVICES DEV | 62009 | 0% | 41% | 11 |
10 | SEMICOND DISPLAY | 44285 | 0% | 80% | 4 |
Journals |
chi_square_rank | term | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
---|---|---|---|---|---|
1 | ECS JOURNAL OF SOLID STATE SCIENCE AND TECHNOLOGY | 90052 | 4% | 7% | 98 |
2 | JOURNAL OF THE ELECTROCHEMICAL SOCIETY | 55706 | 15% | 1% | 352 |
3 | ELECTROCHEMICAL AND SOLID STATE LETTERS | 34249 | 5% | 2% | 103 |
4 | IEEE TRANSACTIONS ON SEMICONDUCTOR MANUFACTURING | 31063 | 3% | 4% | 60 |
5 | MICROELECTRONIC ENGINEERING | 27568 | 6% | 1% | 144 |
6 | SOLID STATE TECHNOLOGY | 19264 | 2% | 3% | 51 |
7 | MICRO | 13265 | 1% | 7% | 13 |
8 | INTERNATIONAL JOURNAL OF PRECISION ENGINEERING AND MANUFACTURING-GREEN TECHNOLOGY | 7800 | 0% | 6% | 10 |
9 | CIRP ANNALS-MANUFACTURING TECHNOLOGY | 5446 | 1% | 1% | 31 |
10 | JAPANESE JOURNAL OF APPLIED PHYSICS | 4367 | 3% | 0% | 73 |
Author Key Words |
Core articles |
The table includes core articles in the class. The following variables is taken into account for the relevance score of an article in a cluster c: (1) Number of references referring to publications in the class. (2) Share of total number of active references referring to publications in the class. (3) Age of the article. New articles get higher score than old articles. (4) Citation rate, normalized to year. |
Classes with closest relation at Level 1 |