Class information for: |
Basic class information |
Hierarchy of classes |
The table includes all classes above and classes immediately below the current class. |
Cluster id | Level | Cluster label | #P |
---|---|---|---|
1 | 4 | PHYSICS, CONDENSED MATTER//PHYSICS, APPLIED//MATERIALS SCIENCE, MULTIDISCIPLINARY | 2188495 |
521 | 3 | SILICON CARBIDE//4H SIC//SIC | 21253 |
695 | 2 | SILICON CARBIDE//4H SIC//SIC | 13432 |
2616 | 1 | MICROPIPE//SUBLIMATION GROWTH//SEMICONDUCTING SILICON COMPOUNDS | 2223 |
Terms with highest relevance score |
rank | Category | termType | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
---|---|---|---|---|---|---|
1 | MICROPIPE | authKW | 1102633 | 4% | 79% | 99 |
2 | SUBLIMATION GROWTH | authKW | 605426 | 3% | 69% | 62 |
3 | SEMICONDUCTING SILICON COMPOUNDS | authKW | 435489 | 4% | 39% | 78 |
4 | 4H SIC | authKW | 336659 | 5% | 20% | 120 |
5 | GROWTH FROM VAPOR | authKW | 249893 | 4% | 22% | 81 |
6 | PHYSICAL VAPOR TRANSPORT | authKW | 241150 | 2% | 49% | 35 |
7 | SEMICONDUCTING SILICON CARBIDE | authKW | 222492 | 1% | 83% | 19 |
8 | MATERIALS SCIENCE FORUM | journal | 221216 | 23% | 3% | 520 |
9 | SIC BULK GROWTH | authKW | 215618 | 1% | 89% | 17 |
10 | BASAL PLANE DISLOCATION | authKW | 213469 | 1% | 94% | 16 |
Web of Science journal categories |
chi_square_rank | Category | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
---|---|---|---|---|---|
1 | Materials Science, Multidisciplinary | 14383 | 56% | 0% | 1248 |
2 | Physics, Applied | 11217 | 46% | 0% | 1022 |
3 | Crystallography | 10967 | 19% | 0% | 426 |
4 | Materials Science, Characterization, Testing | 10564 | 9% | 0% | 195 |
5 | Materials Science, Coatings & Films | 4132 | 10% | 0% | 226 |
6 | Physics, Condensed Matter | 2718 | 20% | 0% | 440 |
7 | Engineering, Electrical & Electronic | 485 | 11% | 0% | 249 |
8 | Physics, Multidisciplinary | 110 | 5% | 0% | 111 |
9 | Optics | 73 | 4% | 0% | 87 |
10 | Metallurgy & Metallurgical Engineering | 45 | 3% | 0% | 56 |
Address terms |
chi_square_rank | term | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
---|---|---|---|---|---|
1 | MAT SCI 6 | 165543 | 2% | 28% | 42 |
2 | PHYS MEASUREMENT TECHNOL | 144752 | 6% | 8% | 127 |
3 | UMR 5614LTPCM | 94499 | 0% | 67% | 10 |
4 | ADV POWER DEVICE | 78499 | 1% | 46% | 12 |
5 | MAT 6 | 74566 | 0% | 48% | 11 |
6 | RD ASSOC FUTURE ELE ON DEVICES | 60159 | 1% | 28% | 15 |
7 | DEV SIC MAT PROC | 56703 | 0% | 100% | 4 |
8 | ETUD SEMICOND GRP | 51897 | 2% | 8% | 44 |
9 | ADV POWER ELECT | 51638 | 1% | 15% | 24 |
10 | MULTIMAT INTER ES | 51557 | 2% | 7% | 49 |
Journals |
chi_square_rank | term | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
---|---|---|---|---|---|
1 | MATERIALS SCIENCE FORUM | 221216 | 23% | 3% | 520 |
2 | JOURNAL OF CRYSTAL GROWTH | 49857 | 15% | 1% | 333 |
3 | MATERIALS SCIENCE AND ENGINEERING B-SOLID STATE MATERIALS FOR ADVANCED TECHNOLOGY | 12851 | 4% | 1% | 82 |
4 | JOURNAL OF ELECTRONIC MATERIALS | 5206 | 3% | 1% | 62 |
5 | INSTITUTE OF PHYSICS CONFERENCE SERIES | 4630 | 3% | 1% | 57 |
6 | SEMICONDUCTORS | 2731 | 2% | 1% | 37 |
7 | JAPANESE JOURNAL OF APPLIED PHYSICS | 2242 | 2% | 0% | 52 |
8 | APPLIED PHYSICS EXPRESS | 1909 | 1% | 1% | 23 |
9 | APPLIED PHYSICS LETTERS | 1709 | 5% | 0% | 122 |
10 | CHEMICAL VAPOR DEPOSITION | 1704 | 0% | 1% | 11 |
Author Key Words |
Core articles |
The table includes core articles in the class. The following variables is taken into account for the relevance score of an article in a cluster c: (1) Number of references referring to publications in the class. (2) Share of total number of active references referring to publications in the class. (3) Age of the article. New articles get higher score than old articles. (4) Citation rate, normalized to year. |
Classes with closest relation at Level 1 |