Class information for: |
Basic class information |
Hierarchy of classes |
The table includes all classes above and classes immediately below the current class. |
Cluster id | Level | Cluster label | #P |
---|---|---|---|
1 | 4 | PHYSICS, CONDENSED MATTER//PHYSICS, APPLIED//MATERIALS SCIENCE, MULTIDISCIPLINARY | 2188495 |
521 | 3 | SILICON CARBIDE//4H SIC//SIC | 21253 |
695 | 2 | SILICON CARBIDE//4H SIC//SIC | 13432 |
15508 | 1 | OHMIC CONTACT//P TYPE SIC//P TYPE 4H SIC | 736 |
Terms with highest relevance score |
rank | Category | termType | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
---|---|---|---|---|---|---|
1 | OHMIC CONTACT | authKW | 1056610 | 21% | 16% | 156 |
2 | P TYPE SIC | authKW | 144228 | 1% | 42% | 8 |
3 | P TYPE 4H SIC | authKW | 133810 | 1% | 63% | 5 |
4 | AL TI CONTACTS | authKW | 128461 | 0% | 100% | 3 |
5 | SXFS | authKW | 128461 | 0% | 100% | 3 |
6 | SILICON CARBIDE | authKW | 127293 | 16% | 3% | 119 |
7 | SPECIFIC CONTACT RESISTANCE | authKW | 115363 | 2% | 17% | 16 |
8 | MATH SCI SPORTS EDUC | address | 96344 | 0% | 75% | 3 |
9 | 4H SIC | authKW | 86493 | 5% | 6% | 35 |
10 | HIGH RESOLUTION AND ANALYTICAL ELECTRON MICROSCOPY HAADF STEM Z CONTRAST | authKW | 85641 | 0% | 100% | 2 |
Web of Science journal categories |
chi_square_rank | Category | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
---|---|---|---|---|---|
1 | Physics, Applied | 3290 | 43% | 0% | 320 |
2 | Materials Science, Coatings & Films | 3056 | 15% | 0% | 110 |
3 | Physics, Condensed Matter | 2367 | 31% | 0% | 225 |
4 | Materials Science, Multidisciplinary | 2239 | 40% | 0% | 293 |
5 | Engineering, Electrical & Electronic | 1052 | 24% | 0% | 176 |
6 | Materials Science, Characterization, Testing | 495 | 3% | 0% | 25 |
7 | Nanoscience & Nanotechnology | 212 | 7% | 0% | 50 |
8 | Chemistry, Physical | 84 | 10% | 0% | 76 |
9 | Physics, Multidisciplinary | 77 | 6% | 0% | 47 |
10 | Metallurgy & Metallurgical Engineering | 47 | 4% | 0% | 27 |
Address terms |
chi_square_rank | term | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
---|---|---|---|---|---|
1 | MATH SCI SPORTS EDUC | 96344 | 0% | 75% | 3 |
2 | MRG | 53722 | 1% | 16% | 8 |
3 | CEA TECHNOL AVANCEES LETI DMEL | 42820 | 0% | 100% | 1 |
4 | CHIM STRUTTURIST CHIM | 42820 | 0% | 100% | 1 |
5 | CNRS CEA SNECMA PROP SOLIDE UB1 | 42820 | 0% | 100% | 1 |
6 | CNRS CEA UMR6157 | 42820 | 0% | 100% | 1 |
7 | CNRSCEA SNECMA PROP SOLIDE | 42820 | 0% | 100% | 1 |
8 | DEPARMENT ADV MAT SCI | 42820 | 0% | 100% | 1 |
9 | FT2 EV | 42820 | 0% | 100% | 1 |
10 | IIMEP | 42820 | 0% | 100% | 1 |
Journals |
chi_square_rank | term | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
---|---|---|---|---|---|
1 | MATERIALS SCIENCE FORUM | 21749 | 13% | 1% | 94 |
2 | MATERIALS SCIENCE AND ENGINEERING B-SOLID STATE MATERIALS FOR ADVANCED TECHNOLOGY | 4527 | 4% | 0% | 28 |
3 | JOURNAL OF ELECTRONIC MATERIALS | 4495 | 4% | 0% | 33 |
4 | SOLID-STATE ELECTRONICS | 3324 | 4% | 0% | 28 |
5 | SEMICONDUCTORS | 2686 | 3% | 0% | 21 |
6 | APPLIED SURFACE SCIENCE | 2422 | 6% | 0% | 46 |
7 | INSTITUTE OF PHYSICS CONFERENCE SERIES | 2287 | 3% | 0% | 23 |
8 | DIAMOND AND RELATED MATERIALS | 1280 | 2% | 0% | 15 |
9 | JOURNAL OF APPLIED PHYSICS | 1267 | 8% | 0% | 58 |
10 | MICROELECTRONIC ENGINEERING | 1167 | 2% | 0% | 17 |
Author Key Words |
Core articles |
The table includes core articles in the class. The following variables is taken into account for the relevance score of an article in a cluster c: (1) Number of references referring to publications in the class. (2) Share of total number of active references referring to publications in the class. (3) Age of the article. New articles get higher score than old articles. (4) Citation rate, normalized to year. |
Classes with closest relation at Level 1 |