Class information for: |
Basic class information |
Hierarchy of classes |
The table includes all classes above and classes immediately below the current class. |
| Cluster id | Level | Cluster label | #P |
|---|---|---|---|
| 8 | 4 | POLYMER SCIENCE//CHEMISTRY, PHYSICAL//MATERIALS SCIENCE, MULTIDISCIPLINARY | 1554940 |
| 54 | 3 | PHOTONIC CRYSTAL//OPTICS//METAMATERIALS | 95723 |
| 2238 | 2 | MUELLER MATRIX//ELLIPSOMETRY//IMAGING ELLIPSOMETRY | 5024 |
| 28168 | 1 | IMAGING ELLIPSOMETRY//TOTAL INTERNAL REFLECTION ELLIPSOMETRY//TOTAL INTERNAL REFLECTION IMAGING ELLIPSOMETRY | 232 |
Terms with highest relevance score |
| rank | Category | termType | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
|---|---|---|---|---|---|---|
| 1 | IMAGING ELLIPSOMETRY | authKW | 2869183 | 15% | 60% | 35 |
| 2 | TOTAL INTERNAL REFLECTION ELLIPSOMETRY | authKW | 978098 | 5% | 60% | 12 |
| 3 | TOTAL INTERNAL REFLECTION IMAGING ELLIPSOMETRY | authKW | 543393 | 2% | 100% | 4 |
| 4 | IMAGING ELLIPSOMETER | authKW | 305657 | 1% | 75% | 3 |
| 5 | FULL FIELD ROTATING ANALYZER ELLIPSOMETRY | authKW | 271697 | 1% | 100% | 2 |
| 6 | WEAK AFFINITY INTERACTION | authKW | 271697 | 1% | 100% | 2 |
| 7 | NML | address | 241645 | 6% | 14% | 13 |
| 8 | PHOTOELASTIC MODULATOR | authKW | 206994 | 3% | 19% | 8 |
| 9 | ICHTEN GRENZFLACHEN 4 | address | 181130 | 1% | 67% | 2 |
| 10 | OFF NULL ELLIPSOMETRY | authKW | 181130 | 1% | 67% | 2 |
Web of Science journal categories |
| chi_square_rank | Category | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
|---|---|---|---|---|---|
| 1 | Materials Science, Coatings & Films | 982 | 15% | 0% | 35 |
| 2 | Instruments & Instrumentation | 620 | 17% | 0% | 39 |
| 3 | Optics | 523 | 21% | 0% | 48 |
| 4 | Physics, Applied | 522 | 32% | 0% | 74 |
| 5 | Electrochemistry | 395 | 12% | 0% | 27 |
| 6 | Chemistry, Analytical | 260 | 16% | 0% | 36 |
| 7 | Physics, Condensed Matter | 219 | 18% | 0% | 41 |
| 8 | Materials Science, Multidisciplinary | 115 | 19% | 0% | 43 |
| 9 | Nanoscience & Nanotechnology | 34 | 5% | 0% | 12 |
| 10 | Engineering, General | 34 | 3% | 0% | 8 |
Address terms |
| chi_square_rank | term | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
|---|---|---|---|---|---|
| 1 | NML | 241645 | 6% | 14% | 13 |
| 2 | ICHTEN GRENZFLACHEN 4 | 181130 | 1% | 67% | 2 |
| 3 | TIN KA PING PHOTON | 181130 | 1% | 67% | 2 |
| 4 | ELE OPT PROGRAM | 135848 | 0% | 100% | 1 |
| 5 | INSERMLAIUMR 1067 | 135848 | 0% | 100% | 1 |
| 6 | ISG4 | 135848 | 0% | 100% | 1 |
| 7 | OPT RUMENTAT GRP | 135848 | 0% | 100% | 1 |
| 8 | PALADIN BIOCHEM | 135848 | 0% | 100% | 1 |
| 9 | PLASMAS COUCHES MINCE | 135848 | 0% | 100% | 1 |
| 10 | SYTH ELE OSYNTH ORGANOMET | 135848 | 0% | 100% | 1 |
Journals |
| chi_square_rank | term | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
|---|---|---|---|---|---|
| 1 | THIN SOLID FILMS | 1774 | 9% | 0% | 22 |
| 2 | APPLIED OPTICS | 1648 | 9% | 0% | 21 |
| 3 | GENETIC ENGINEERING NEWS | 1390 | 1% | 0% | 3 |
| 4 | SENSORS AND ACTUATORS B-CHEMICAL | 1315 | 6% | 0% | 14 |
| 5 | REVIEW OF SCIENTIFIC INSTRUMENTS | 620 | 5% | 0% | 12 |
| 6 | MEASUREMENT SCIENCE AND TECHNOLOGY | 513 | 3% | 0% | 6 |
| 7 | BIOSENSORS & BIOELECTRONICS | 472 | 3% | 0% | 6 |
| 8 | JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS | 340 | 4% | 0% | 9 |
| 9 | APPLIED SURFACE SCIENCE | 287 | 4% | 0% | 9 |
| 10 | METHODS IN MICROBIOLOGY | 284 | 0% | 0% | 1 |
Author Key Words |
Core articles |
The table includes core articles in the class. The following variables is taken into account for the relevance score of an article in a cluster c: (1) Number of references referring to publications in the class. (2) Share of total number of active references referring to publications in the class. (3) Age of the article. New articles get higher score than old articles. (4) Citation rate, normalized to year. |
Classes with closest relation at Level 1 |