Class information for:
Level 2: MUELLER MATRIX//ELLIPSOMETRY//IMAGING ELLIPSOMETRY

Basic class information
Bar chart of Publication_year

Last years might be incomplete

Hierarchy of classes
The table includes all classes above and classes immediately below the current class.


Cluster id Level Cluster label #P
8 4 POLYMER SCIENCE//CHEMISTRY, PHYSICAL//MATERIALS SCIENCE, MULTIDISCIPLINARY 1554940
54 3       PHOTONIC CRYSTAL//OPTICS//METAMATERIALS 95723
2238 2             MUELLER MATRIX//ELLIPSOMETRY//IMAGING ELLIPSOMETRY 5024
5441 1                   MUELLER MATRIX//SHENZHEN MINIMAL INVAS MED TECHNOL//OPT IMAGING SENSING 1654
10753 1                   NANOOPT PROPERTY//PLASMA PHYS PLASMA SOURCES//NON UNIFORM THIN FILMS 1066
16785 1                   INFRARED ELLIPSOMETRY//ROTATING POLARIZER ANALYZER ELLIPSOMETER//BERLIN 661
20819 1                   WAVE PLATE//PHASE RETARDANCE//RETARDANCE 468
25190 1                   QUARTERWAVE RETARDERS//SINGLE LAYER COATING//ABSORBING SUBSTRATE 312
27607 1                   ACOUSTO OPTIC PHONONS//BILINEAR TRANSFORMED REFLECTANCE//CHANNELING MEASUREMENTS 245
27706 1                   ABELES EQUATIONS//ELLIPSOMETRY PLICAT//ERROR PARALLELEPIPEDS 243
28168 1                   IMAGING ELLIPSOMETRY//TOTAL INTERNAL REFLECTION ELLIPSOMETRY//TOTAL INTERNAL REFLECTION IMAGING ELLIPSOMETRY 232
33108 1                   ALUMINUM DOPED ZINC OXIDE ZNOAL//ALUMINUM NANOFILM//ULTRAVIOLET VISIBLE NEAR INFRARED UV VIS NIR 143

Terms with highest relevance score


rank Category termType chi_square shrOfCwithTerm shrOfTermInClass termInClass
1 MUELLER MATRIX authKW 529848 3% 55% 153
2 ELLIPSOMETRY authKW 244427 6% 12% 313
3 IMAGING ELLIPSOMETRY authKW 132427 1% 60% 35
4 SPECTROSCOPIC ELLIPSOMETRY authKW 117483 3% 13% 147
5 NANOOPT PROPERTY address 116061 1% 49% 38
6 SHENZHEN MINIMAL INVAS MED TECHNOL address 90414 1% 45% 32
7 PLASMA PHYS PLASMA SOURCES address 75451 0% 63% 19
8 POLARIMETRY authKW 67767 2% 11% 100
9 OPTICS WoSSC 61236 46% 0% 2309
10 WAVE PLATE authKW 59706 0% 48% 20

Web of Science journal categories


chi_square_rank Category chi_square shrOfCwithTerm shrOfTermInClass termInClass
1 Optics 61236 46% 0% 2309
2 Materials Science, Coatings & Films 12456 12% 0% 586
3 Physics, Applied 10161 30% 0% 1528
4 Physics, Condensed Matter 4358 17% 0% 857
5 Materials Science, Multidisciplinary 1408 15% 0% 753
6 Instruments & Instrumentation 1075 5% 0% 273
7 Spectroscopy 663 4% 0% 190
8 Physics, Multidisciplinary 310 5% 0% 269
9 Biochemical Research Methods 132 3% 0% 136
10 Engineering, Electrical & Electronic 72 5% 0% 258

Address terms


chi_square_rank term chi_square shrOfCwithTerm shrOfTermInClass termInClass
1 NANOOPT PROPERTY 116061 1% 49% 38
2 SHENZHEN MINIMAL INVAS MED TECHNOL 90414 1% 45% 32
3 PLASMA PHYS PLASMA SOURCES 75451 0% 63% 19
4 LPICM 58876 1% 15% 63
5 OPT IMAGING SENSING 58871 1% 29% 32
6 BIOPHYS BIOIMAGING 43857 1% 25% 28
7 ARAGONES ESTADIST 38410 0% 88% 7
8 PHYS IMAGE PROC GRP 33204 0% 38% 14
9 MED BIOPHYS RADIAT ONCOL 29173 0% 42% 11
10 UNION SHENZHEN HOSP 28212 0% 50% 9

Journals


chi_square_rank term chi_square shrOfCwithTerm shrOfTermInClass termInClass
1 APPLIED OPTICS 59177 12% 2% 584
2 JOURNAL OF THE OPTICAL SOCIETY OF AMERICA A-OPTICS IMAGE SCIENCE AND VISION 37714 5% 2% 246
3 THIN SOLID FILMS 26822 8% 1% 399
4 JOURNAL OF BIOMEDICAL OPTICS 10211 2% 2% 95
5 OPTICS EXPRESS 8372 4% 1% 222
6 OPTICS LETTERS 7321 4% 1% 191
7 OPTICS COMMUNICATIONS 4761 3% 1% 145
8 OPTICAL ENGINEERING 4644 2% 1% 105
9 OPTIK 4142 2% 1% 88
10 JOURNAL OF APPLIED PHYSICS 2919 5% 0% 237

Author Key Words


chi_square_rank term chi_square shrOfCwithTerm shrOfTermInClass termInClass LCSH search Wikipedia search
1 MUELLER MATRIX 529848 3% 55% 153 Search MUELLER+MATRIX Search MUELLER+MATRIX
2 ELLIPSOMETRY 244427 6% 12% 313 Search ELLIPSOMETRY Search ELLIPSOMETRY
3 IMAGING ELLIPSOMETRY 132427 1% 60% 35 Search IMAGING+ELLIPSOMETRY Search IMAGING+ELLIPSOMETRY
4 SPECTROSCOPIC ELLIPSOMETRY 117483 3% 13% 147 Search SPECTROSCOPIC+ELLIPSOMETRY Search SPECTROSCOPIC+ELLIPSOMETRY
5 POLARIMETRY 67767 2% 11% 100 Search POLARIMETRY Search POLARIMETRY
6 WAVE PLATE 59706 0% 48% 20 Search WAVE+PLATE Search WAVE+PLATE
7 RETARDANCE 56579 0% 48% 19 Search RETARDANCE Search RETARDANCE
8 POLARIMETRIC IMAGING 52081 0% 46% 18 Search POLARIMETRIC+IMAGING Search POLARIMETRIC+IMAGING
9 STOKES VECTOR 51807 0% 36% 23 Search STOKES+VECTOR Search STOKES+VECTOR
10 TOTAL INTERNAL REFLECTION ELLIPSOMETRY 45144 0% 60% 12 Search TOTAL+INTERNAL+REFLECTION+ELLIPSOMETRY Search TOTAL+INTERNAL+REFLECTION+ELLIPSOMETRY

Core articles
The table includes core articles in the class. The following variables is taken into account for the relevance score of an article in a cluster c:
(1) Number of references referring to publications in the class.
(2) Share of total number of active references referring to publications in the class.
(3) Age of the article. New articles get higher score than old articles.
(4) Citation rate, normalized to year.

Classes with closest relation at Level 2


rank cluster_id2 link
1 2353 LASER INDUCED DAMAGE//OPTICAL COATINGS//LASER INDUCED DAMAGE THRESHOLD
2 1663 JOURNAL OF BIOMEDICAL OPTICS//OPTICAL COHERENCE TOMOGRAPHY//BIOMEDICAL OPTICS EXPRESS
3 3554 DIGITAL PHOTOELASTICITY//PHOTOELASTICITY//ISOCHROMATICS
4 3254 POLARIZATION INTERFERENCE IMAGING SPECTROMETER//IMAGING SPECTROMETER//FOURIER TRANSFORM SPECTROMETER
5 2791 SCULPTURED THIN FILMS//GLANCING ANGLE DEPOSITION//CIRCULAR BRAGG PHENOMENON
6 2835 GUIDED MODE RESONANCE//RIGOROUS COUPLED WAVE ANALYSIS//SUBWAVELENGTH GRATING
7 2872 RANDOM LASER//RANDOM LASING//NANOOPT MESOSCOP OPT
8 3935 FONORITON SCI//CHEM HIGH PUR SUBST//ISOTOPE MIXED CRYSTALS
9 389 MICROCRYSTALLINE SILICON//JOURNAL OF NON-CRYSTALLINE SOLIDS//AMORPHOUS SILICON
10 3314 CLEANROOM//PHOTORESIST REMOVAL//MINIENVIRONMENT

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