Class information for: |
Basic class information |
Hierarchy of classes |
The table includes all classes above and classes immediately below the current class. |
| Cluster id | Level | Cluster label | #P |
|---|---|---|---|
| 8 | 4 | POLYMER SCIENCE//CHEMISTRY, PHYSICAL//MATERIALS SCIENCE, MULTIDISCIPLINARY | 1554940 |
| 54 | 3 | PHOTONIC CRYSTAL//OPTICS//METAMATERIALS | 95723 |
| 2238 | 2 | MUELLER MATRIX//ELLIPSOMETRY//IMAGING ELLIPSOMETRY | 5024 |
| 16785 | 1 | INFRARED ELLIPSOMETRY//ROTATING POLARIZER ANALYZER ELLIPSOMETER//BERLIN | 661 |
Terms with highest relevance score |
| rank | Category | termType | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
|---|---|---|---|---|---|---|
| 1 | INFRARED ELLIPSOMETRY | authKW | 227911 | 2% | 34% | 14 |
| 2 | ROTATING POLARIZER ANALYZER ELLIPSOMETER | authKW | 143038 | 0% | 100% | 3 |
| 3 | BERLIN | address | 117321 | 4% | 10% | 24 |
| 4 | APPROXIMATION OF REFLECTION COEFFICIENT | authKW | 95358 | 0% | 100% | 2 |
| 5 | INCOHERENT REFLECTION | authKW | 95358 | 0% | 100% | 2 |
| 6 | LOCAL APPARENT BARRIER HEIGHT | authKW | 95358 | 0% | 100% | 2 |
| 7 | REAL TIME SPECTROSCOPIC ELLIPSOMETRY SE | authKW | 95358 | 0% | 100% | 2 |
| 8 | ROTATING COMPENSATOR ELLIPSOMETER RCE | authKW | 95358 | 0% | 100% | 2 |
| 9 | UPR 258 CNRS | address | 85820 | 0% | 60% | 3 |
| 10 | ELLIPSOMETRY | authKW | 75331 | 10% | 3% | 63 |
Web of Science journal categories |
| chi_square_rank | Category | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
|---|---|---|---|---|---|
| 1 | Materials Science, Coatings & Films | 7773 | 25% | 0% | 164 |
| 2 | Physics, Applied | 4440 | 52% | 0% | 347 |
| 3 | Physics, Condensed Matter | 1474 | 26% | 0% | 171 |
| 4 | Optics | 1121 | 18% | 0% | 120 |
| 5 | Materials Science, Multidisciplinary | 1016 | 30% | 0% | 195 |
| 6 | Instruments & Instrumentation | 536 | 10% | 0% | 64 |
| 7 | Materials Science, Ceramics | 416 | 5% | 0% | 35 |
| 8 | Spectroscopy | 264 | 6% | 0% | 40 |
| 9 | Chemistry, Physical | 36 | 8% | 0% | 55 |
| 10 | Chemistry, Analytical | 25 | 4% | 0% | 28 |
Address terms |
| chi_square_rank | term | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
|---|---|---|---|---|---|
| 1 | BERLIN | 117321 | 4% | 10% | 24 |
| 2 | UPR 258 CNRS | 85820 | 0% | 60% | 3 |
| 3 | PHYS INTER ES COUCHES MINCES | 57939 | 3% | 5% | 23 |
| 4 | COND MATT PHYS | 47679 | 0% | 100% | 1 |
| 5 | CORPORATED RD | 47679 | 0% | 100% | 1 |
| 6 | GVC E B009 | 47679 | 0% | 100% | 1 |
| 7 | INS SI PHOTOVOLTA | 47679 | 0% | 100% | 1 |
| 8 | INTER ES COUCHES MINCES | 47679 | 0% | 100% | 1 |
| 9 | SPACE SCI SD48 | 47679 | 0% | 100% | 1 |
| 10 | UMB 7647 | 47679 | 0% | 100% | 1 |
Journals |
| chi_square_rank | term | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
|---|---|---|---|---|---|
| 1 | THIN SOLID FILMS | 17814 | 18% | 0% | 117 |
| 2 | JOURNAL OF NON-CRYSTALLINE SOLIDS | 2342 | 5% | 0% | 34 |
| 3 | JOURNAL OF THE OPTICAL SOCIETY OF AMERICA A-OPTICS IMAGE SCIENCE AND VISION | 2279 | 3% | 0% | 22 |
| 4 | APPLIED SPECTROSCOPY | 2248 | 3% | 0% | 20 |
| 5 | REVIEW OF SCIENTIFIC INSTRUMENTS | 1747 | 5% | 0% | 34 |
| 6 | APPLIED OPTICS | 1671 | 5% | 0% | 36 |
| 7 | JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A | 1442 | 3% | 0% | 21 |
| 8 | VIDE-SCIENCE TECHNIQUE ET APPLICATIONS | 884 | 0% | 1% | 3 |
| 9 | JOURNAL OF OPTICS-NOUVELLE REVUE D OPTIQUE | 653 | 0% | 0% | 3 |
| 10 | JOURNAL OF APPLIED PHYSICS | 619 | 6% | 0% | 39 |
Author Key Words |
Core articles |
The table includes core articles in the class. The following variables is taken into account for the relevance score of an article in a cluster c: (1) Number of references referring to publications in the class. (2) Share of total number of active references referring to publications in the class. (3) Age of the article. New articles get higher score than old articles. (4) Citation rate, normalized to year. |
Classes with closest relation at Level 1 |