Class information for: |
Basic class information |
Hierarchy of classes |
The table includes all classes above and classes immediately below the current class. |
Cluster id | Level | Cluster label | #P |
---|---|---|---|
8 | 4 | POLYMER SCIENCE//CHEMISTRY, PHYSICAL//MATERIALS SCIENCE, MULTIDISCIPLINARY | 1554940 |
54 | 3 | PHOTONIC CRYSTAL//OPTICS//METAMATERIALS | 95723 |
2238 | 2 | MUELLER MATRIX//ELLIPSOMETRY//IMAGING ELLIPSOMETRY | 5024 |
10753 | 1 | NANOOPT PROPERTY//PLASMA PHYS PLASMA SOURCES//NON UNIFORM THIN FILMS | 1066 |
Terms with highest relevance score |
rank | Category | termType | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
---|---|---|---|---|---|---|
1 | NANOOPT PROPERTY | address | 518846 | 3% | 47% | 37 |
2 | PLASMA PHYS PLASMA SOURCES | address | 355739 | 2% | 63% | 19 |
3 | NON UNIFORM THIN FILMS | authKW | 177384 | 1% | 100% | 6 |
4 | ELLIPSOMETRY | authKW | 175218 | 11% | 5% | 122 |
5 | SPECTROSCOPIC ELLIPSOMETRY | authKW | 168372 | 8% | 7% | 81 |
6 | JOINT MODERN METROL | address | 105583 | 0% | 71% | 5 |
7 | RG PLASMA TECHNOL | address | 94595 | 1% | 40% | 8 |
8 | DIELECTRIC FUNCTION | authKW | 94253 | 5% | 7% | 48 |
9 | SPECTROSCOPIC REFLECTOMETRY | authKW | 90532 | 1% | 44% | 7 |
10 | DIELECTRIC FUNCTION PARAMETRIC MODEL | authKW | 88692 | 0% | 100% | 3 |
Web of Science journal categories |
chi_square_rank | Category | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
---|---|---|---|---|---|
1 | Materials Science, Coatings & Films | 8049 | 20% | 0% | 213 |
2 | Physics, Applied | 6873 | 52% | 0% | 549 |
3 | Physics, Condensed Matter | 4228 | 34% | 0% | 359 |
4 | Materials Science, Multidisciplinary | 1163 | 26% | 0% | 272 |
5 | Optics | 614 | 11% | 0% | 120 |
6 | Physics, Multidisciplinary | 310 | 9% | 0% | 100 |
7 | Instruments & Instrumentation | 67 | 3% | 0% | 36 |
8 | Nuclear Science & Technology | 52 | 3% | 0% | 30 |
9 | Chemistry, Physical | 48 | 8% | 0% | 84 |
10 | Engineering, Electrical & Electronic | 33 | 6% | 0% | 65 |
Address terms |
chi_square_rank | term | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
---|---|---|---|---|---|
1 | NANOOPT PROPERTY | 518846 | 3% | 47% | 37 |
2 | PLASMA PHYS PLASMA SOURCES | 355739 | 2% | 63% | 19 |
3 | JOINT MODERN METROL | 105583 | 0% | 71% | 5 |
4 | RG PLASMA TECHNOL | 94595 | 1% | 40% | 8 |
5 | CDP BAGNEUX | 59128 | 0% | 100% | 2 |
6 | JOINT CHAIR EXPT PHYS | 59128 | 0% | 100% | 2 |
7 | CZECH METROL | 49267 | 0% | 33% | 5 |
8 | NANO OPT PROPERTY | 49267 | 0% | 33% | 5 |
9 | ADV DISPLAY RS | 29564 | 0% | 100% | 1 |
10 | ANAL SHOWA KU | 29564 | 0% | 100% | 1 |
Journals |
chi_square_rank | term | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
---|---|---|---|---|---|
1 | THIN SOLID FILMS | 15071 | 13% | 0% | 137 |
2 | JOURNAL OF APPLIED PHYSICS | 5912 | 14% | 0% | 148 |
3 | JOURNAL OF THE KOREAN PHYSICAL SOCIETY | 3118 | 4% | 0% | 41 |
4 | ACTA PHYSICA SLOVACA | 2649 | 1% | 1% | 9 |
5 | SURFACE AND INTERFACE ANALYSIS | 1882 | 2% | 0% | 21 |
6 | APPLIED SURFACE SCIENCE | 1298 | 4% | 0% | 41 |
7 | APPLIED OPTICS | 953 | 3% | 0% | 35 |
8 | JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS | 863 | 3% | 0% | 31 |
9 | APPLIED PHYSICS LETTERS | 663 | 5% | 0% | 53 |
10 | DIAMOND AND RELATED MATERIALS | 654 | 1% | 0% | 13 |
Author Key Words |
Core articles |
The table includes core articles in the class. The following variables is taken into account for the relevance score of an article in a cluster c: (1) Number of references referring to publications in the class. (2) Share of total number of active references referring to publications in the class. (3) Age of the article. New articles get higher score than old articles. (4) Citation rate, normalized to year. |
Classes with closest relation at Level 1 |