Class information for: |
Basic class information |
Hierarchy of classes |
The table includes all classes above and classes immediately below the current class. |
Cluster id | Level | Cluster label | #P |
---|---|---|---|
1 | 4 | PHYSICS, CONDENSED MATTER//PHYSICS, APPLIED//MATERIALS SCIENCE, MULTIDISCIPLINARY | 2188495 |
375 | 3 | MICROSCOPY//ULTRAMICROSCOPY//JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA | 34629 |
824 | 2 | ULTRAMICROSCOPY//MICROSCOPY//ELECTRON HOLOGRAPHY | 12082 |
25087 | 1 | NANOSKIVING//ULTRAMICROTOMY//LOW ANGLE ION MILLING | 314 |
Terms with highest relevance score |
rank | Category | termType | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
---|---|---|---|---|---|---|
1 | NANOSKIVING | authKW | 535309 | 3% | 67% | 8 |
2 | ULTRAMICROTOMY | authKW | 282693 | 4% | 22% | 13 |
3 | LOW ANGLE ION MILLING | authKW | 200743 | 1% | 100% | 2 |
4 | MAT SCI PROD TECHNOL | address | 200743 | 1% | 100% | 2 |
5 | PEELS IMAGING | authKW | 200743 | 1% | 100% | 2 |
6 | XTEM SAMPLE PREPARATION | authKW | 200743 | 1% | 100% | 2 |
7 | MICROSCOPY CHARACTERIZAT MAT | address | 180666 | 1% | 60% | 3 |
8 | ELECTRONIC RADIATION | authKW | 133827 | 1% | 67% | 2 |
9 | TECHNOL PLANNING CENT ELECT S | address | 133827 | 1% | 67% | 2 |
10 | ION BEAM THINNING | authKW | 112914 | 1% | 38% | 3 |
Web of Science journal categories |
chi_square_rank | Category | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
---|---|---|---|---|---|
1 | Microscopy | 35253 | 36% | 0% | 113 |
2 | Biology | 721 | 14% | 0% | 44 |
3 | Anatomy & Morphology | 648 | 6% | 0% | 20 |
4 | Physics, Condensed Matter | 382 | 20% | 0% | 62 |
5 | Materials Science, Multidisciplinary | 311 | 25% | 0% | 77 |
6 | Physics, Applied | 299 | 22% | 0% | 69 |
7 | Physics, Multidisciplinary | 293 | 15% | 0% | 48 |
8 | Metallurgy & Metallurgical Engineering | 283 | 11% | 0% | 34 |
9 | Nanoscience & Nanotechnology | 132 | 8% | 0% | 25 |
10 | Materials Science, Characterization, Testing | 62 | 2% | 0% | 6 |
Address terms |
chi_square_rank | term | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
---|---|---|---|---|---|
1 | MAT SCI PROD TECHNOL | 200743 | 1% | 100% | 2 |
2 | MICROSCOPY CHARACTERIZAT MAT | 180666 | 1% | 60% | 3 |
3 | TECHNOL PLANNING CENT ELECT S | 133827 | 1% | 67% | 2 |
4 | ENGN PL SCI PL PHYS GRP | 100371 | 0% | 100% | 1 |
5 | EO OPERAT SHINJUKU KU | 100371 | 0% | 100% | 1 |
6 | GRONINGEN PHARMANCY | 100371 | 0% | 100% | 1 |
7 | KAVLI BIONANOSCI TECHNOL | 100371 | 0% | 100% | 1 |
8 | PL MICROSCOPY GRP | 100371 | 0% | 100% | 1 |
9 | RUMENTAT MESU | 37634 | 1% | 13% | 3 |
10 | ANAT SERV | 20073 | 0% | 20% | 1 |
Journals |
chi_square_rank | term | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
---|---|---|---|---|---|
1 | JOURNAL OF ELECTRON MICROSCOPY TECHNIQUE | 79368 | 8% | 3% | 24 |
2 | INSTITUTE OF PHYSICS CONFERENCE SERIES | 11190 | 11% | 0% | 33 |
3 | MICROSCOPY RESEARCH AND TECHNIQUE | 10205 | 6% | 1% | 20 |
4 | ULTRAMICROSCOPY | 8509 | 7% | 0% | 22 |
5 | JOURNAL DE MICROSCOPIE ET DE SPECTROSCOPIE ELECTRONIQUES | 5445 | 2% | 1% | 5 |
6 | METALLOGRAPHY | 3131 | 1% | 1% | 3 |
7 | CRYSTAL LATTICE DEFECTS | 3040 | 0% | 3% | 1 |
8 | MICROLITHOGRAPHY WORLD | 1928 | 0% | 2% | 1 |
9 | RADIATION EFFECTS LETTERS | 1813 | 1% | 1% | 2 |
10 | RADIATION EFFECTS AND DEFECTS IN SOLIDS | 1721 | 3% | 0% | 9 |
Author Key Words |
chi_square_rank | term | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass | LCSH search | Wikipedia search |
---|---|---|---|---|---|---|---|
1 | NANOSKIVING | 535309 | 3% | 67% | 8 | Search NANOSKIVING | Search NANOSKIVING |
2 | ULTRAMICROTOMY | 282693 | 4% | 22% | 13 | Search ULTRAMICROTOMY | Search ULTRAMICROTOMY |
3 | LOW ANGLE ION MILLING | 200743 | 1% | 100% | 2 | Search LOW+ANGLE+ION+MILLING | Search LOW+ANGLE+ION+MILLING |
4 | PEELS IMAGING | 200743 | 1% | 100% | 2 | Search PEELS+IMAGING | Search PEELS+IMAGING |
5 | XTEM SAMPLE PREPARATION | 200743 | 1% | 100% | 2 | Search XTEM+SAMPLE+PREPARATION | Search XTEM+SAMPLE+PREPARATION |
6 | ELECTRONIC RADIATION | 133827 | 1% | 67% | 2 | Search ELECTRONIC+RADIATION | Search ELECTRONIC+RADIATION |
7 | ION BEAM THINNING | 112914 | 1% | 38% | 3 | Search ION+BEAM+THINNING | Search ION+BEAM+THINNING |
8 | ALUMINA NICKEL BICRYSTALS | 100371 | 0% | 100% | 1 | Search ALUMINA+NICKEL+BICRYSTALS | Search ALUMINA+NICKEL+BICRYSTALS |
9 | ALUMINIUM STRIPS | 100371 | 0% | 100% | 1 | Search ALUMINIUM+STRIPS | Search ALUMINIUM+STRIPS |
10 | CHEMICAL JET | 100371 | 0% | 100% | 1 | Search CHEMICAL+JET | Search CHEMICAL+JET |
Core articles |
The table includes core articles in the class. The following variables is taken into account for the relevance score of an article in a cluster c: (1) Number of references referring to publications in the class. (2) Share of total number of active references referring to publications in the class. (3) Age of the article. New articles get higher score than old articles. (4) Citation rate, normalized to year. |
Classes with closest relation at Level 1 |