Class information for: |
Basic class information |
Hierarchy of classes |
The table includes all classes above and classes immediately below the current class. |
| Cluster id | Level | Cluster label | #P |
|---|---|---|---|
| 1 | 4 | PHYSICS, CONDENSED MATTER//PHYSICS, APPLIED//MATERIALS SCIENCE, MULTIDISCIPLINARY | 2188495 |
| 64 | 3 | SEMICONDUCTOR LASERS//PHYSICS, APPLIED//PHYSICS, CONDENSED MATTER | 89567 |
| 1236 | 2 | GAINNAS//DILUTE NITRIDES//ANTIMONIDES | 9317 |
| 30508 | 1 | FIELD INDUCED JUNCTION//INSB GATE CONTROLLED DIODE//MESA EDGE TRENCH | 182 |
Terms with highest relevance score |
| rank | Category | termType | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
|---|---|---|---|---|---|---|
| 1 | FIELD INDUCED JUNCTION | authKW | 173170 | 1% | 100% | 1 |
| 2 | INSB GATE CONTROLLED DIODE | authKW | 173170 | 1% | 100% | 1 |
| 3 | MESA EDGE TRENCH | authKW | 173170 | 1% | 100% | 1 |
| 4 | PHOTOVOLTAIC METHOD | authKW | 173170 | 1% | 100% | 1 |
| 5 | PIXEL LINEARITY | authKW | 173170 | 1% | 100% | 1 |
| 6 | SEKT PHYS BEREICH TIEFTEMPERATUR FESTKORPERPHYS | address | 173170 | 1% | 100% | 1 |
| 7 | MESA STEP HEIGHT | authKW | 86584 | 1% | 50% | 1 |
| 8 | IMAGE ARRAY | authKW | 57722 | 1% | 33% | 1 |
| 9 | CHARGE INJECTION DEVICE CID | authKW | 43291 | 1% | 25% | 1 |
| 10 | LAVOISIER IREM | address | 34632 | 1% | 20% | 1 |
Web of Science journal categories |
| chi_square_rank | Category | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
|---|---|---|---|---|---|
| 1 | Physics, Applied | 1557 | 59% | 0% | 107 |
| 2 | Materials Science, Coatings & Films | 441 | 12% | 0% | 21 |
| 3 | Engineering, Electrical & Electronic | 406 | 29% | 0% | 53 |
| 4 | Physics, Condensed Matter | 367 | 25% | 0% | 45 |
| 5 | Materials Science, Multidisciplinary | 138 | 22% | 0% | 40 |
| 6 | Spectroscopy | 35 | 4% | 0% | 8 |
| 7 | Optics | 28 | 7% | 0% | 12 |
| 8 | Physics, Multidisciplinary | 21 | 7% | 0% | 12 |
| 9 | Electrochemistry | 17 | 3% | 0% | 6 |
| 10 | Nanoscience & Nanotechnology | 12 | 4% | 0% | 7 |
Address terms |
| chi_square_rank | term | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
|---|---|---|---|---|---|
| 1 | SEKT PHYS BEREICH TIEFTEMPERATUR FESTKORPERPHYS | 173170 | 1% | 100% | 1 |
| 2 | LAVOISIER IREM | 34632 | 1% | 20% | 1 |
| 3 | PHYSICOCHEM PROBLEMS CERAM SCI | 9619 | 1% | 6% | 1 |
| 4 | ENERGY SEMICOND | 2610 | 1% | 1% | 2 |
| 5 | FAK ELEKTROTECH | 2190 | 1% | 1% | 1 |
| 6 | LKO | 2110 | 1% | 1% | 1 |
| 7 | VANT HOFF | 1783 | 1% | 1% | 1 |
| 8 | INGN MET MAT | 1713 | 1% | 1% | 1 |
| 9 | ADV CONVERGENCE TECHNOL | 1502 | 1% | 0% | 2 |
| 10 | COUNCIL CANADA | 914 | 1% | 1% | 1 |
Journals |
| chi_square_rank | term | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
|---|---|---|---|---|---|
| 1 | SOVIET MICROELECTRONICS | 5207 | 2% | 1% | 3 |
| 2 | IEEE TRANSACTIONS ON ELECTRON DEVICES | 3172 | 9% | 0% | 17 |
| 3 | IZVESTIYA SIBIRSKOGO OTDELENIYA AKADEMII NAUK SSSR SERIYA KHIMICHESKIKH NAUK | 2548 | 2% | 0% | 4 |
| 4 | FUNKTIONELLE BIOLOGIE & MEDIZIN | 1730 | 1% | 1% | 1 |
| 5 | JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS & EXPRESS LETTERS | 1419 | 5% | 0% | 10 |
| 6 | UKRAINSKII FIZICHESKII ZHURNAL | 1308 | 3% | 0% | 5 |
| 7 | THIN SOLID FILMS | 1194 | 9% | 0% | 16 |
| 8 | PROCEEDINGS OF THE SOCIETY OF PHOTO-OPTICAL INSTRUMENTATION ENGINEERS | 1149 | 3% | 0% | 6 |
| 9 | SOLID-STATE ELECTRONICS | 1100 | 4% | 0% | 8 |
| 10 | SOVIET ELECTROCHEMISTRY | 694 | 2% | 0% | 3 |
Author Key Words |
| chi_square_rank | term | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass | LCSH search | Wikipedia search |
|---|---|---|---|---|---|---|---|
| 1 | FIELD INDUCED JUNCTION | 173170 | 1% | 100% | 1 | Search FIELD+INDUCED+JUNCTION | Search FIELD+INDUCED+JUNCTION |
| 2 | INSB GATE CONTROLLED DIODE | 173170 | 1% | 100% | 1 | Search INSB+GATE+CONTROLLED+DIODE | Search INSB+GATE+CONTROLLED+DIODE |
| 3 | MESA EDGE TRENCH | 173170 | 1% | 100% | 1 | Search MESA+EDGE+TRENCH | Search MESA+EDGE+TRENCH |
| 4 | PHOTOVOLTAIC METHOD | 173170 | 1% | 100% | 1 | Search PHOTOVOLTAIC+METHOD | Search PHOTOVOLTAIC+METHOD |
| 5 | PIXEL LINEARITY | 173170 | 1% | 100% | 1 | Search PIXEL+LINEARITY | Search PIXEL+LINEARITY |
| 6 | MESA STEP HEIGHT | 86584 | 1% | 50% | 1 | Search MESA+STEP+HEIGHT | Search MESA+STEP+HEIGHT |
| 7 | IMAGE ARRAY | 57722 | 1% | 33% | 1 | Search IMAGE+ARRAY | Search IMAGE+ARRAY |
| 8 | CHARGE INJECTION DEVICE CID | 43291 | 1% | 25% | 1 | Search CHARGE+INJECTION+DEVICE+CID | Search CHARGE+INJECTION+DEVICE+CID |
| 9 | MESA ETCHING | 34632 | 1% | 20% | 1 | Search MESA+ETCHING | Search MESA+ETCHING |
| 10 | GASEOUS MOLECULES | 28860 | 1% | 17% | 1 | Search GASEOUS+MOLECULES | Search GASEOUS+MOLECULES |
Core articles |
The table includes core articles in the class. The following variables is taken into account for the relevance score of an article in a cluster c: (1) Number of references referring to publications in the class. (2) Share of total number of active references referring to publications in the class. (3) Age of the article. New articles get higher score than old articles. (4) Citation rate, normalized to year. |
Classes with closest relation at Level 1 |