Class information for: |
Basic class information |
Hierarchy of classes |
The table includes all classes above and classes immediately below the current class. |
Cluster id | Level | Cluster label | #P |
---|---|---|---|
1 | 4 | PHYSICS, CONDENSED MATTER//PHYSICS, APPLIED//MATERIALS SCIENCE, MULTIDISCIPLINARY | 2188495 |
13 | 3 | PHYSICS, APPLIED//IEEE TRANSACTIONS ON ELECTRON DEVICES//SILICON | 136516 |
1594 | 2 | POLYCRYSTALLINE SILICON//POLY SI//THIN FILM TRANSISTORS | 7411 |
633 | 1 | POLY SI//POLYCRYSTALLINE SILICON//POLY SI TFT | 3242 |
Terms with highest relevance score |
rank | Category | termType | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
---|---|---|---|---|---|---|
1 | POLY SI | authKW | 828600 | 5% | 53% | 161 |
2 | POLYCRYSTALLINE SILICON | authKW | 820340 | 7% | 38% | 223 |
3 | POLY SI TFT | authKW | 708876 | 3% | 75% | 97 |
4 | THIN FILM TRANSISTORS | authKW | 667099 | 12% | 18% | 381 |
5 | LASER CRYSTALLIZATION | authKW | 511729 | 2% | 71% | 74 |
6 | EXCIMER LASER CRYSTALLIZATION | authKW | 495389 | 2% | 88% | 58 |
7 | POLYCRYSTALLINE SILICON POLY SI | authKW | 438811 | 2% | 82% | 55 |
8 | THIN FILM TRANSISTOR TFT | authKW | 423103 | 5% | 27% | 163 |
9 | METAL INDUCED LATERAL CRYSTALLIZATION MILC | authKW | 364785 | 1% | 89% | 42 |
10 | TFT | authKW | 327145 | 3% | 31% | 107 |
Web of Science journal categories |
chi_square_rank | Category | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
---|---|---|---|---|---|
1 | Physics, Applied | 34562 | 65% | 0% | 2114 |
2 | Engineering, Electrical & Electronic | 11644 | 36% | 0% | 1171 |
3 | Materials Science, Coatings & Films | 7855 | 12% | 0% | 374 |
4 | Physics, Condensed Matter | 3385 | 18% | 0% | 599 |
5 | Materials Science, Multidisciplinary | 3177 | 24% | 0% | 791 |
6 | COMPUTER APPLICATIONS & CYBERNETICS | 601 | 0% | 0% | 13 |
7 | Materials Science, Ceramics | 389 | 3% | 0% | 82 |
8 | Nanoscience & Nanotechnology | 332 | 5% | 0% | 146 |
9 | Electrochemistry | 223 | 3% | 0% | 94 |
10 | Optics | 179 | 5% | 0% | 149 |
Address terms |
chi_square_rank | term | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
---|---|---|---|---|---|
1 | JOINT SCI TECHNOL | 154011 | 1% | 59% | 27 |
2 | BASE TECHNOL | 152378 | 1% | 56% | 28 |
3 | LCD PROC TECHNOL | 149954 | 1% | 86% | 18 |
4 | SEMICOND ELECT INTEGRAT SCI | 136860 | 1% | 54% | 26 |
5 | TECHNOL PLATFORM | 118228 | 1% | 36% | 34 |
6 | MAT DEVICE PLICAT | 74761 | 0% | 77% | 10 |
7 | ADV DISPLAY | 72312 | 2% | 14% | 52 |
8 | INNOVAT MAT PROC | 65869 | 1% | 34% | 20 |
9 | GRP MICROELECT VISUALISAT | 65304 | 1% | 40% | 17 |
10 | UP A 6076 | 60824 | 0% | 48% | 13 |
Journals |
chi_square_rank | term | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
---|---|---|---|---|---|
1 | IEEE ELECTRON DEVICE LETTERS | 116601 | 10% | 4% | 334 |
2 | IEEE TRANSACTIONS ON ELECTRON DEVICES | 68804 | 10% | 2% | 334 |
3 | JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS | 22847 | 8% | 1% | 272 |
4 | SOLID-STATE ELECTRONICS | 15043 | 4% | 1% | 125 |
5 | JAPANESE JOURNAL OF APPLIED PHYSICS | 14716 | 5% | 1% | 159 |
6 | SOLID STATE PHENOMENA | 12313 | 2% | 2% | 53 |
7 | THIN SOLID FILMS | 9938 | 6% | 1% | 196 |
8 | ELECTROCHEMICAL AND SOLID STATE LETTERS | 9215 | 2% | 2% | 64 |
9 | JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS & EXPRESS LETTERS | 7406 | 3% | 1% | 97 |
10 | JOURNAL OF THE SOCIETY FOR INFORMATION DISPLAY | 6728 | 1% | 2% | 31 |
Author Key Words |
Core articles |
The table includes core articles in the class. The following variables is taken into account for the relevance score of an article in a cluster c: (1) Number of references referring to publications in the class. (2) Share of total number of active references referring to publications in the class. (3) Age of the article. New articles get higher score than old articles. (4) Citation rate, normalized to year. |
Classes with closest relation at Level 1 |