Class information for: |
Basic class information |
Hierarchy of classes |
The table includes all classes above and classes immediately below the current class. |
Terms with highest relevance score |
rank | Category | termType | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
---|---|---|---|---|---|---|
1 | POLYCRYSTALLINE SILICON | authKW | 738721 | 4% | 54% | 320 |
2 | POLY SI | authKW | 457944 | 2% | 60% | 181 |
3 | THIN FILM TRANSISTORS | authKW | 327692 | 5% | 19% | 404 |
4 | POLY SI TFT | authKW | 316421 | 1% | 76% | 98 |
5 | METAL INDUCED CRYSTALLIZATION | authKW | 283157 | 1% | 87% | 77 |
6 | LASER CRYSTALLIZATION | authKW | 268131 | 1% | 78% | 81 |
7 | EXCIMER LASER CRYSTALLIZATION | authKW | 231849 | 1% | 91% | 60 |
8 | POLYCRYSTALLINE SILICON POLY SI | authKW | 206114 | 1% | 85% | 57 |
9 | SOLID PHASE CRYSTALLIZATION | authKW | 203505 | 1% | 59% | 81 |
10 | ALUMINUM INDUCED CRYSTALLIZATION | authKW | 185555 | 1% | 89% | 49 |
Web of Science journal categories |
chi_square_rank | Category | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
---|---|---|---|---|---|
1 | Physics, Applied | 72290 | 63% | 0% | 4634 |
2 | Materials Science, Coatings & Films | 15460 | 11% | 1% | 796 |
3 | Physics, Condensed Matter | 10944 | 22% | 0% | 1594 |
4 | Materials Science, Multidisciplinary | 9739 | 28% | 0% | 2045 |
5 | Engineering, Electrical & Electronic | 9682 | 23% | 0% | 1704 |
6 | Crystallography | 549 | 3% | 0% | 219 |
7 | COMPUTER APPLICATIONS & CYBERNETICS | 548 | 0% | 1% | 19 |
8 | Electrochemistry | 432 | 3% | 0% | 202 |
9 | Physics, Multidisciplinary | 430 | 5% | 0% | 389 |
10 | Materials Science, Ceramics | 385 | 2% | 0% | 133 |
Address terms |
chi_square_rank | term | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
---|---|---|---|---|---|
1 | JOINT SCI TECHNOL | 67343 | 0% | 59% | 27 |
2 | BASE TECHNOL | 66627 | 0% | 56% | 28 |
3 | LCD PROC TECHNOL | 65578 | 0% | 86% | 18 |
4 | SEMICOND ELECT INTEGRAT SCI | 59841 | 0% | 54% | 26 |
5 | TECHNOL PLATFORM | 51682 | 0% | 36% | 34 |
6 | ADV DISPLAY | 32803 | 1% | 15% | 53 |
7 | MAT DEVICE PLICAT | 32694 | 0% | 77% | 10 |
8 | INNOVAT MAT PROC | 28792 | 0% | 34% | 20 |
9 | GRP MICROELECT VISUALISAT | 28549 | 0% | 40% | 17 |
10 | UP A 6076 | 26593 | 0% | 48% | 13 |
Journals |
chi_square_rank | term | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
---|---|---|---|---|---|
1 | IEEE ELECTRON DEVICE LETTERS | 63920 | 5% | 4% | 375 |
2 | IEEE TRANSACTIONS ON ELECTRON DEVICES | 43441 | 5% | 3% | 403 |
3 | THIN SOLID FILMS | 18579 | 5% | 1% | 406 |
4 | JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS | 17015 | 5% | 1% | 358 |
5 | APPLIED PHYSICS LETTERS | 14188 | 8% | 1% | 627 |
6 | IEEE TRANSACTIONS ON SEMICONDUCTOR MANUFACTURING | 12901 | 1% | 4% | 70 |
7 | JOURNAL OF APPLIED PHYSICS | 12526 | 8% | 1% | 579 |
8 | JAPANESE JOURNAL OF APPLIED PHYSICS | 11819 | 3% | 1% | 217 |
9 | SOLID-STATE ELECTRONICS | 10242 | 2% | 2% | 157 |
10 | SOLID STATE PHENOMENA | 8807 | 1% | 3% | 68 |
Author Key Words |
Core articles |
The table includes core articles in the class. The following variables is taken into account for the relevance score of an article in a cluster c: (1) Number of references referring to publications in the class. (2) Share of total number of active references referring to publications in the class. (3) Age of the article. New articles get higher score than old articles. (4) Citation rate, normalized to year. |
Classes with closest relation at Level 2 |