Class information for: |
Basic class information |
Hierarchy of classes |
The table includes all classes above and classes immediately below the current class. |
Cluster id | Level | Cluster label | #P |
---|---|---|---|
1 | 4 | PHYSICS, CONDENSED MATTER//PHYSICS, APPLIED//MATERIALS SCIENCE, MULTIDISCIPLINARY | 2188495 |
13 | 3 | PHYSICS, APPLIED//IEEE TRANSACTIONS ON ELECTRON DEVICES//SILICON | 136516 |
3171 | 2 | WAFER BONDING//ANODIC BONDING//DIRECT BONDING | 2326 |
4923 | 1 | WAFER BONDING//ANODIC BONDING//DIRECT BONDING | 1730 |
Terms with highest relevance score |
rank | Category | termType | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
---|---|---|---|---|---|---|
1 | WAFER BONDING | authKW | 989840 | 10% | 33% | 166 |
2 | ANODIC BONDING | authKW | 901085 | 5% | 57% | 87 |
3 | DIRECT BONDING | authKW | 301114 | 2% | 42% | 39 |
4 | LOW TEMPERATURE BONDING | authKW | 259627 | 2% | 49% | 29 |
5 | SILICON WAFER BONDING | authKW | 245433 | 1% | 84% | 16 |
6 | ROOM TEMPERATURE BONDING | authKW | 242868 | 1% | 67% | 20 |
7 | SURFACE ACTIVATED BONDING | authKW | 218581 | 1% | 67% | 18 |
8 | HERMETICITY | authKW | 163927 | 1% | 50% | 18 |
9 | WAFER DIRECT BONDING | authKW | 146586 | 1% | 62% | 13 |
10 | MEMS PACKAGING | authKW | 145713 | 1% | 50% | 16 |
Web of Science journal categories |
chi_square_rank | Category | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
---|---|---|---|---|---|
1 | Physics, Applied | 13469 | 56% | 0% | 973 |
2 | Engineering, Electrical & Electronic | 8150 | 41% | 0% | 708 |
3 | Instruments & Instrumentation | 7371 | 21% | 0% | 363 |
4 | Nanoscience & Nanotechnology | 6392 | 21% | 0% | 371 |
5 | Materials Science, Multidisciplinary | 3571 | 34% | 0% | 580 |
6 | Materials Science, Coatings & Films | 2599 | 9% | 0% | 159 |
7 | Electrochemistry | 940 | 7% | 0% | 119 |
8 | Mechanics | 637 | 8% | 0% | 132 |
9 | Physics, Condensed Matter | 277 | 9% | 0% | 151 |
10 | Engineering, Manufacturing | 208 | 2% | 0% | 38 |
Address terms |
chi_square_rank | term | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
---|---|---|---|---|---|
1 | WAFER BONDING | 72860 | 0% | 67% | 6 |
2 | ADV MICROSYST INTEGRAT PACKAGING | 36432 | 0% | 100% | 2 |
3 | FUNDAMENTAL SCI NOVEL MICRO NANO DEV | 36432 | 0% | 100% | 2 |
4 | OPTOELECT OKI | 36432 | 0% | 100% | 2 |
5 | PRECIS ENGN | 31991 | 3% | 3% | 54 |
6 | MODERN MFG QUAL ENGN | 24287 | 0% | 67% | 2 |
7 | ORION ELECT CO LTD | 24287 | 0% | 67% | 2 |
8 | ZENTRUM MIKROTECHNOL | 24279 | 0% | 22% | 6 |
9 | SP2M NRS | 20489 | 0% | 38% | 3 |
10 | ADV ELECT COMPONENT SECT | 18216 | 0% | 100% | 1 |
Journals |
chi_square_rank | term | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass |
---|---|---|---|---|---|
1 | JOURNAL OF MICROMECHANICS AND MICROENGINEERING | 37215 | 6% | 2% | 108 |
2 | SENSORS AND ACTUATORS A-PHYSICAL | 34708 | 8% | 1% | 139 |
3 | MICROSYSTEM TECHNOLOGIES-MICRO-AND NANOSYSTEMS-INFORMATION STORAGE AND PROCESSING SYSTEMS | 28090 | 4% | 2% | 76 |
4 | JOURNAL OF MICROELECTROMECHANICAL SYSTEMS | 24386 | 4% | 2% | 61 |
5 | IEEE TRANSACTIONS ON ADVANCED PACKAGING | 12117 | 2% | 3% | 26 |
6 | ECS JOURNAL OF SOLID STATE SCIENCE AND TECHNOLOGY | 10344 | 2% | 2% | 29 |
7 | JOURNAL OF THE ELECTROCHEMICAL SOCIETY | 6648 | 6% | 0% | 107 |
8 | PHILIPS JOURNAL OF RESEARCH | 5435 | 1% | 3% | 10 |
9 | IEEE TRANSACTIONS ON COMPONENTS PACKAGING AND MANUFACTURING TECHNOLOGY | 4092 | 1% | 1% | 18 |
10 | ECS SOLID STATE LETTERS | 3232 | 0% | 2% | 8 |
Author Key Words |
chi_square_rank | term | chi_square | shrOfCwithTerm | shrOfTermInClass | termInClass | LCSH search | Wikipedia search |
---|---|---|---|---|---|---|---|
1 | WAFER BONDING | 989840 | 10% | 33% | 166 | Search WAFER+BONDING | Search WAFER+BONDING |
2 | ANODIC BONDING | 901085 | 5% | 57% | 87 | Search ANODIC+BONDING | Search ANODIC+BONDING |
3 | DIRECT BONDING | 301114 | 2% | 42% | 39 | Search DIRECT+BONDING | Search DIRECT+BONDING |
4 | LOW TEMPERATURE BONDING | 259627 | 2% | 49% | 29 | Search LOW+TEMPERATURE+BONDING | Search LOW+TEMPERATURE+BONDING |
5 | SILICON WAFER BONDING | 245433 | 1% | 84% | 16 | Search SILICON+WAFER+BONDING | Search SILICON+WAFER+BONDING |
6 | ROOM TEMPERATURE BONDING | 242868 | 1% | 67% | 20 | Search ROOM+TEMPERATURE+BONDING | Search ROOM+TEMPERATURE+BONDING |
7 | SURFACE ACTIVATED BONDING | 218581 | 1% | 67% | 18 | Search SURFACE+ACTIVATED+BONDING | Search SURFACE+ACTIVATED+BONDING |
8 | HERMETICITY | 163927 | 1% | 50% | 18 | Search HERMETICITY | Search HERMETICITY |
9 | WAFER DIRECT BONDING | 146586 | 1% | 62% | 13 | Search WAFER+DIRECT+BONDING | Search WAFER+DIRECT+BONDING |
10 | MEMS PACKAGING | 145713 | 1% | 50% | 16 | Search MEMS+PACKAGING | Search MEMS+PACKAGING |
Core articles |
The table includes core articles in the class. The following variables is taken into account for the relevance score of an article in a cluster c: (1) Number of references referring to publications in the class. (2) Share of total number of active references referring to publications in the class. (3) Age of the article. New articles get higher score than old articles. (4) Citation rate, normalized to year. |
Classes with closest relation at Level 1 |