IH2652 Methods and Instruments of Analysis 7.5 credits

Analysmetoder och analysinstrument

Advanced materials analysis is of crucial importance for an increasing amount of high-tech applications based on control and understanding of material properties down to the atomic scale. This includes structural, optical, electrical, and other physical properties and often requires a plethora of different and complementary methods for a full analysis and understanding.

This course aims to give an overview of a range of analytical methods and instruments of particular importance for applied materials research and nanotechnology. These include ion beam-based methods, electron microscopies, scanning probe microscopy, X-ray diffraction, electric and optical methods, as well as electron and photon spectroscopies. Extensive laboratory exercises provide the students with the opportunity to test hands-on various analytical tools that are available at the School of Information and Communication Technology research departments.

  • Education cycle

    Second cycle
  • Main field of study

    Electrical Engineering
  • Grading scale

    A, B, C, D, E, FX, F

Course offerings

Autumn 19 TNTEM for programme students

Autumn 18 TNTEM for programme students

Intended learning outcomes

After completing the course the students should be able to:

  • Describe the contruction and functionality of a range of advanced materials analysis methods relevant for applied materials research, especially semiconducor technology and nanotechnology.
  • Chose an appropriate analysis method or combination of analysis methods to address a specific material issue.
  • Correlate measurment results obtained from different methods.
  • Analyse and interpret measurement results.
  • Be able to suggest the need for additional complemntary analysis.
  • Understand and being able to critically examine material analysis related results presented in the scientific literature or in other contexts.
  • Being able to independently use some materials characterization set-ups that are available at the School of Information and Communication Technology.

Course main content

Theory and Laboration excercizes (the latter labeled with *) for the following methods:

  • X-ray diffraction (XRD)*
  • Scanning Probe Microscopy (SPM)*
  • Ion beam-based methods (SIMS, RBS*)
  • Electron microscopy (TEM, SEM*)
  • Photoelectron spectroscopies  (XPS, UPS, Auger, etc.)
  • Electrical characterization 
  • Optical characterization (phtoluminescnce spectroscopy, Raman, FTIR, etc.)


Lectures (11x2h), laborations (3x4 h), study visit (half day, Ion Technology Center, Uppsala Univeristy), written exam.


Basic physics courses at the bachelor level, incl. optics and waves, electromagnetics and solid state physics.

Recommended prerequisites

Physics from bachelor level or within the master's program (Optics, Thermodynamics, Electromagnetism,  Solid State Physics and Semiconductor Physics)


Selected parts of the books listed below as well as articles and/or other supplements to the lectures.

  • T.L. Alford, L.C. Feldman, J.W. Mayer, “Fundamentals of Nanoscale Film Analysis” Springer, 2007.
  • Y. Lang, “Materials Characterization, Introduction to Microscopic and Spectroscopic Methods”, Wiley, 2008.
  • Pelant and J. Valenta, “Luminescence Spectroscopy of Semiconductors”, Oxford, 2012.
  • D.K. Schroder, “Semiconductor Material and Device Characterization, Third Edition”, Wiley, 2006.


  • LAB1 - Laboratory Course, 2.5, grading scale: P, F
  • TEN1 - Examination, 5.0, grading scale: A, B, C, D, E, FX, F

Requirements for final grade

Approved laboration course (LAB1, 2.5 credits) as well as written exam (TEN1, 5 credits). Approval on the laboration course require active participation in all laboration exercizes as well as solved preporatory problems and a well-structured laboration report. 

Offered by

EECS/Electronics and Embedded Systems


Mattias Hammar (hammar@kth.se)


Mattias Hammar <hammar@kth.se>

Supplementary information

Also offered for PhD students:

IH3606 Materials Characterization for Electronics and Photonics


Course syllabus valid from: Spring 2019.
Examination information valid from: Spring 2019.