FIH3601 Statistical Methods in Microelectronics 7.5 credits

• Statistical fundamentals
• Use of statistical software (SPSS or R)
• Yield Modeling
• Statistical process control (SPC)
• Design of Experiments (DOE)
• Process modeling

After the course you should be familiar with statistical methods used in microelectronics, and especially you should be able to perform process control, design experiments and present findings using statistical methods and professional software such as SPSS or R.

An undergraduate course in statistics is required

Knowledge of process technology for semiconductors is recommended

If the course is discontinued, students may request to be examined during the following two academic years.

• EXA1 - Examination, 7.5 credits, grading scale: P, F

Based on recommendation from KTH’s coordinator for disabilities, the examiner will decide how to adapt an examination for students with documented disability.

The examiner may apply another examination format when re-examining individual students.

P/F

Homework, Labs and an individual Project

The project should be individual and connected to your research. This part of the course can be finished later, in most cases hopefully by producing a scientific  publication, where at least one of the statistical methods learnt in the course should be included.

Carl-Mikael Zetterling

• All members of a group are responsible for the group's work.
• In any assessment, every student shall honestly disclose any help received and sources used.
• In an oral assessment, every student shall be able to present and answer questions about the entire assignment and solution.

Further information about the course can be found on the Course web at the link below. Information on the Course web will later be moved to this site.