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FIH3603 Semiconductor Electrical Characterization 7.5 credits

Information per course offering

Termin

Information for Autumn 2025 The course will start in P2 and labs and home assignments will continue into P3. Most of the lecture material is available in pre-recorded videos. programme students

Course location

KTH Campus

Duration
27 Oct 2025 - 12 Jan 2026
Periods

Autumn 2025: P2 (7.5 hp)

Pace of study

50%

Application code

10565

Form of study

Distance Daytime

Language of instruction

English

Course memo
Course memo is not published
Number of places

Places are not limited

Target group
No information inserted
Planned modular schedule
[object Object]
Schedule
Schedule is not published
Part of programme
No information inserted

Contact

Examiner
No information inserted
Course coordinator
No information inserted
Teachers
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Course syllabus as PDF

Please note: all information from the Course syllabus is available on this page in an accessible format.

Course syllabus FIH3603 (Spring 2019–)
Headings with content from the Course syllabus FIH3603 (Spring 2019–) are denoted with an asterisk ( )

Content and learning outcomes

Course contents

Low level measurements of current, voltage and impedance for nanoelectronic devices.

Circuit design basics and use of dedicated measurement tools such as source-measure units, nanovoltmeters, picoampmeters and impedance meters.

Shielding and four-point techniques including force-sense configuration, calibration and de-embedding.

Yield and reliability measurements and figure of merits.

Statistical limitations and design of experiments

Advanced measurements tools for high-frequency, high power and circuit evaluation.

Circuit evaluation basics including ESD protection and handling.

Intended learning outcomes

After the course the students should have an advanced working knowledge in dedicated measurement tools for semiconductor devices and low level measurements tools in general. The student should be familiar with tools for high frequency, high power (voltage/current) and circuit evaluation.
They should be able to independently perform relevant measurements on advanced nanoelectronic devices and circuit prototypes.
The student should be able to use calibration or deembedding techniques in their experimental design and in the analysis of the measurement data.
The students should be familiar with the use of electrical characterization in yield and reliability especially with an industry perspective.
The students should be able to consider statistical limitations in their choice of characterization tools and routines.

Literature and preparations

Specific prerequisites

PhD level only

Recommended prerequisites

Semiconductor devices and physics or a general course in nanoelectronics required  (graduate level recommended). Working knowledge of (analog) circuit analysis including operational amplifiers, minimum undergraduate level. Knowledge of process technology for semiconductors is required, minimum undergraduate level.

Literature

You can find information about course literature either in the course memo for the course offering or in the course room in Canvas.

Examination and completion

Grading scale

P, F

Examination

  • EXA1 - Examination, 7.5 credits, grading scale: P, F

Based on recommendation from KTH’s coordinator for disabilities, the examiner will decide how to adapt an examination for students with documented disability.

The examiner may apply another examination format when re-examining individual students.

If the course is discontinued, students may request to be examined during the following two academic years.

Laboratory exercises in group, individual seminar task for oral presentation, and final individual laboratory project with written report.

Other requirements for final grade

Laboratory exercises in group, individual seminar task for oral presentation, and final individual laboratory project with written report.

Examiner

Ethical approach

  • All members of a group are responsible for the group's work.
  • In any assessment, every student shall honestly disclose any help received and sources used.
  • In an oral assessment, every student shall be able to present and answer questions about the entire assignment and solution.

Further information

Course room in Canvas

Registered students find further information about the implementation of the course in the course room in Canvas. A link to the course room can be found under the tab Studies in the Personal menu at the start of the course.

Offered by

Education cycle

Third cycle

Postgraduate course

Postgraduate courses at EECS/Electronics and Embedded Systems