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FIH3603 Semiconductor Electrical Characterization 7.5 credits

Course offerings are missing for current or upcoming semesters.
Headings with content from the Course syllabus FIH3603 (Spring 2019–) are denoted with an asterisk ( )

Content and learning outcomes

Course contents

Low level measurements of current, voltage and impedance for nanoelectronic devices.

Circuit design basics and use of dedicated measurement tools such as source-measure units, nanovoltmeters, picoampmeters and impedance meters.

Shielding and four-point techniques including force-sense configuration, calibration and de-embedding.

Yield and reliability measurements and figure of merits.

Statistical limitations and design of experiments

Advanced measurements tools for high-frequency, high power and circuit evaluation.

Circuit evaluation basics including ESD protection and handling.

Intended learning outcomes

After the course the students should have an advanced working knowledge in dedicated measurement tools for semiconductor devices and low level measurements tools in general. The student should be familiar with tools for high frequency, high power (voltage/current) and circuit evaluation.
They should be able to independently perform relevant measurements on advanced nanoelectronic devices and circuit prototypes.
The student should be able to use calibration or deembedding techniques in their experimental design and in the analysis of the measurement data.
The students should be familiar with the use of electrical characterization in yield and reliability especially with an industry perspective.
The students should be able to consider statistical limitations in their choice of characterization tools and routines.

Literature and preparations

Specific prerequisites

PhD level only

Recommended prerequisites

Semiconductor devices and physics or a general course in nanoelectronics required  (graduate level recommended). Working knowledge of (analog) circuit analysis including operational amplifiers, minimum undergraduate level. Knowledge of process technology for semiconductors is required, minimum undergraduate level.

Equipment

No information inserted

Literature

No information inserted

Examination and completion

If the course is discontinued, students may request to be examined during the following two academic years.

Grading scale

P, F

Examination

  • EXA1 - Examination, 7.5 credits, grading scale: P, F

Based on recommendation from KTH’s coordinator for disabilities, the examiner will decide how to adapt an examination for students with documented disability.

The examiner may apply another examination format when re-examining individual students.

Laboratory exercises in group, individual seminar task for oral presentation, and final individual laboratory project with written report.

Other requirements for final grade

Laboratory exercises in group, individual seminar task for oral presentation, and final individual laboratory project with written report.

Opportunity to complete the requirements via supplementary examination

No information inserted

Opportunity to raise an approved grade via renewed examination

No information inserted

Examiner

Ethical approach

  • All members of a group are responsible for the group's work.
  • In any assessment, every student shall honestly disclose any help received and sources used.
  • In an oral assessment, every student shall be able to present and answer questions about the entire assignment and solution.

Further information

Course room in Canvas

Registered students find further information about the implementation of the course in the course room in Canvas. A link to the course room can be found under the tab Studies in the Personal menu at the start of the course.

Offered by

Main field of study

This course does not belong to any Main field of study.

Education cycle

Third cycle

Add-on studies

No information inserted

Contact

Gunnar Malm (gunta@kth.se)

Postgraduate course

Postgraduate courses at EECS/Electronics and Embedded Systems