FIH3606 Material Characterization for Electronics and Photonics 10.5 credits

Materialkarakterisering för elektronik och fotonik

Offering and execution

Course offering missing for current semester as well as for previous and coming semesters

Course information

Content and learning outcomes

Course contents *

The lectures cover the theory and main operating principles for several commonly used characterization techniques, such as: X-ray diffraction (XRD), atom force microscopy (AFM), Rutherford backscattering spectroscopy (RBS), secondary ion mass spectroscopy (SIMS), scanning electron microscopy (SEM), transmission electron microscopy (TEM), four-point probe resistivity measurements, Hall measurement and photoluminescence (PL). A large emphasis is also put on hands-on experience and individual training on the various analytical tools.

Intended learning outcomes *

This course gives insight into basic structural, electrical and optical characterization techniques for semiconductor materials used in electronic and photonic applications. After finishing the course, the students should:

·be able to select measurement technique with appropriate sensitivity and resolution.

·possess sufficient hands-on experience from the instruments which are part of the laboratory course to be able to use them.

·be familiar to and able to analyze, interpret and validate spectra and measurement results from the techniques that are presented in the course.

·be able to correlate and cross-examine measurement results obtained using different techniques.

·reach a sufficient competence level in one of the studied techniques to be able to present own data in scientific journals.

Course Disposition

No information inserted

Literature and preparations

Specific prerequisites *

Basic knowledge in optics, electromagnetism, solid state physics and semiconductor physics.

Recommended prerequisites

Basic physics and chemistry courses

Equipment

No information inserted

Literature

Lecture notes and selected articles from scientific journals are available on the course homepage.

Examination and completion

Grading scale *

P, F

Examination *

    Based on recommendation from KTH’s coordinator for disabilities, the examiner will decide how to adapt an examination for students with documented disability.

    The examiner may apply another examination format when re-examining individual students.

    Grading scale: Pass/Fail

    Other requirements for final grade *

    For passing the course the student need to:

    • pass the laborative exercises.
    • Approved individual project after oral examination
    • Oral presentation of principles and measured results for one selected technique.

    Langugae of instruction: English only

    Opportunity to complete the requirements via supplementary examination

    No information inserted

    Opportunity to raise an approved grade via renewed examination

    No information inserted

    Examiner

    Mattias Hammar

    Further information

    Course web

    Further information about the course can be found on the Course web at the link below. Information on the Course web will later be moved to this site.

    Course web FIH3606

    Offered by

    EECS/Electronics and Embedded Systems

    Main field of study *

    No information inserted

    Education cycle *

    Third cycle

    Add-on studies

    no

    Ethical approach *

    • All members of a group are responsible for the group's work.
    • In any assessment, every student shall honestly disclose any help received and sources used.
    • In an oral assessment, every student shall be able to present and answer questions about the entire assignment and solution.

    Postgraduate course

    Postgraduate courses at EECS/Electronics and Embedded Systems