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FIH3606 Material Characterization for Electronics and Photonics 10.5 credits

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Application

For course offering

Autumn 2023 Start 30 Oct 2023 programme students

Application code

51417

Headings with content from the Course syllabus FIH3606 (Spring 2019–) are denoted with an asterisk ( )

Content and learning outcomes

Course contents

The lectures cover the theory and main operating principles for several commonly used characterization techniques, such as: X-ray diffraction (XRD), atom force microscopy (AFM), Rutherford backscattering spectroscopy (RBS), secondary ion mass spectroscopy (SIMS), scanning electron microscopy (SEM), transmission electron microscopy (TEM), four-point probe resistivity measurements, Hall measurement and photoluminescence (PL). A large emphasis is also put on hands-on experience and individual training on the various analytical tools.

Intended learning outcomes

This course gives insight into basic structural, electrical and optical characterization techniques for semiconductor materials used in electronic and photonic applications. After finishing the course, the students should:

·be able to select measurement technique with appropriate sensitivity and resolution.

·possess sufficient hands-on experience from the instruments which are part of the laboratory course to be able to use them.

·be familiar to and able to analyze, interpret and validate spectra and measurement results from the techniques that are presented in the course.

·be able to correlate and cross-examine measurement results obtained using different techniques.

·reach a sufficient competence level in one of the studied techniques to be able to present own data in scientific journals.

Literature and preparations

Specific prerequisites

Basic knowledge in optics, electromagnetism, solid state physics and semiconductor physics.

Recommended prerequisites

Basic physics and chemistry courses

Equipment

No information inserted

Literature

No information inserted

Examination and completion

If the course is discontinued, students may request to be examined during the following two academic years.

Grading scale

P, F

Examination

  • EXA1 - Examination, 10.5 credits, grading scale: P, F

Based on recommendation from KTH’s coordinator for disabilities, the examiner will decide how to adapt an examination for students with documented disability.

The examiner may apply another examination format when re-examining individual students.

Grading scale: Pass/Fail

Other requirements for final grade

For passing the course the student need to:

  • pass the laborative exercises.
  • Approved individual project after oral examination
  • Oral presentation of principles and measured results for one selected technique.

Langugae of instruction: English only

Opportunity to complete the requirements via supplementary examination

No information inserted

Opportunity to raise an approved grade via renewed examination

No information inserted

Examiner

Ethical approach

  • All members of a group are responsible for the group's work.
  • In any assessment, every student shall honestly disclose any help received and sources used.
  • In an oral assessment, every student shall be able to present and answer questions about the entire assignment and solution.

Further information

Course room in Canvas

Registered students find further information about the implementation of the course in the course room in Canvas. A link to the course room can be found under the tab Studies in the Personal menu at the start of the course.

Offered by

Main field of study

This course does not belong to any Main field of study.

Education cycle

Third cycle

Add-on studies

no

Postgraduate course

Postgraduate courses at EECS/Electronics and Embedded Systems