FIM3002 Advanced Topics in Materials Science 6.0 credits

Avancerade ämnen i materialvetenskap

The course is based on open literature and below listed textbooks where the course participants are demanded very active participation. The course is conducted in a seminar form,  with discussion and analysis of how topographic, morphological, compositional and crystallographic information are deduced using scanning and transmission electron microscopes. 

There will be six demo sessions on the three electron microscopes (TEM, SEM and FIB-SEM) under the supervision of EM experts, to demonstrate the effective use of the techniques for the generation of desired information from a variety of samples.

Offering and execution

Course offering missing for current semester as well as for previous and coming semesters

Course information

Content and learning outcomes

Course contents *

The course is based on open literature and below listed textbooks where the course participants are demanded very active participation. The course is conducted in a seminar form,  with discussion and analysis of how topographic, morphological, compositional and crystallographic information are deduced using scanning and transmission electron microscopes.  

Intended learning outcomes *

Fundamental understanding of

  • energetic electrons interaction with matter
  • primary and secondary signals sources and   utility of such interactions
  • qualitative and quantitative analytical techniques associated with the interaction
  • basic physics of interaction
  • interrelations between transmission, diffraction, absorption and reflection phenomena 

Course Disposition

The course is planned in form of seminar modules. Students will do seminars during the course and it is compulsory to attend all seminar events during the active period of the course.

Literature and preparations

Specific prerequisites *

No information inserted

Recommended prerequisites

No information inserted

Equipment

No information inserted

Literature

Selectedresearch articlesandthe following books

Scanning Electron Microscopy and X-Ray Microanalysis.              Joseph I. Goldstein etl.     1992

Electron Backscatter Diffraction in Materials Science.                   Adam J. Schwartz etl.        2000

Electron Energy Loss Spectroscopy     Rik Brydson 2006

Electron Crystallography  Xiaodong Zou etl.              2011

Examination and completion

Grading scale *

No information inserted

Examination *

No information inserted

Based on recommendation from KTH’s coordinator for disabilities, the examiner will decide how to adapt an examination for students with documented disability.

The examiner may apply another examination format when re-examining individual students.

Opportunity to complete the requirements via supplementary examination

No information inserted

Opportunity to raise an approved grade via renewed examination

No information inserted

Examiner

Joydeep Dutta

Further information

Course web

No information inserted

Offered by

SCI/Applied Physics

Main field of study *

No information inserted

Education cycle *

Third cycle

Add-on studies

No information inserted

Contact

Joydeep Dutta

Ethical approach *

  • All members of a group are responsible for the group's work.
  • In any assessment, every student shall honestly disclose any help received and sources used.
  • In an oral assessment, every student shall be able to present and answer questions about the entire assignment and solution.

Postgraduate course

Postgraduate courses at SCI/Applied Physics