The course is based on open literature and below listed textbooks where the course participants are demanded very active participation. The course is conducted in a seminar form, with discussion and analysis of how topographic, morphological, compositional and crystallographic information are deduced using scanning and transmission electron microscopes.
FIM3002 Advanced Topics in Materials Science 6.0 credits
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Course syllabus as PDF
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Course syllabus FIM3002 (Spring 2011–)Content and learning outcomes
Course contents
Intended learning outcomes
Fundamental understanding of
- energetic electrons interaction with matter
- primary and secondary signals sources and utility of such interactions
- qualitative and quantitative analytical techniques associated with the interaction
- basic physics of interaction
- interrelations between transmission, diffraction, absorption and reflection phenomena
Literature and preparations
Specific prerequisites
Literature
Selectedresearch articlesandthe following books
Scanning Electron Microscopy and X-Ray Microanalysis. Joseph I. Goldstein etl. 1992
Electron Backscatter Diffraction in Materials Science. Adam J. Schwartz etl. 2000
Electron Energy Loss Spectroscopy Rik Brydson 2006
Electron Crystallography Xiaodong Zou etl. 2011
Examination and completion
Grading scale
Examination
Based on recommendation from KTH’s coordinator for disabilities, the examiner will decide how to adapt an examination for students with documented disability.
The examiner may apply another examination format when re-examining individual students.
If the course is discontinued, students may request to be examined during the following two academic years.
Examiner
Ethical approach
- All members of a group are responsible for the group's work.
- In any assessment, every student shall honestly disclose any help received and sources used.
- In an oral assessment, every student shall be able to present and answer questions about the entire assignment and solution.