FSK3740 Introduktion till svepprob-mikroskopi 6,0 hp

The course is designed for students from a wide variety of educational backgrounds, from Physics, Chemistry and Biology, who would like to learn about the technical details of how SPMs work, and the possibilities and pitfalls in interpreting the images that SPM's produce.  We will look in detail at some of the many different modes of SPM usage, with particular emphasis on Atomic Force Microscopy (AFM) and its many variations. 

• SPM overview
• Scanners, Sensors, Feedback and Control
• Cantilevers and Tips, Force Measurements
• Fluctuations, Noise and Fundamental Limits
• Surface Forces, Adhesion and Friction
• AFM Colloidal Probe Technique
• SPM Applications in Microelectronics
• Nonlinear Cantilever Dynamics

• To provide the theoretical background and physical intuitation necessary to understand how SPM's operate and how to interpret the images they produce. 
• To provide an practical, hands-on introduction to the operation of SPMs in a laboratory setting. 

Solid background in Physics, Chemistry and Biology.

Language of instruction: English

Various articles, lecture notes, and training manuals, made available to participating students.

När kurs inte längre ges har student möjlighet att examineras under ytterligare två läsår.

• LAB1 - Laborationer, 6,0 hp, betygsskala: G

Examinator beslutar, baserat på rekommendation från KTH:s handläggare av stöd till studenter med funktionsnedsättning, om eventuell anpassad examination för studenter med dokumenterad, varaktig funktionsnedsättning.

Examinator får medge annan examinationsform vid omexamination av enstaka studenter.

LAB1 - Laborationer 6 hp 

Two Written lab reports, and either one  literature project or one simulation project.

David B Haviland

• Vid grupparbete har alla i gruppen ansvar för gruppens arbete.
• Vid examination ska varje student ärligt redovisa hjälp som erhållits och källor som använts.
• Vid muntlig examination ska varje student kunna redogöra för hela uppgiften och hela lösningen.