The overall goal of the course is that you should be able to describe the function of the pn-diode, the bipolar and the MOS transistor and how these three devices are used in applications. You should be able to derive and calculate the currents inside these devices and be able to analyse the internal state of the charge distribution, the electric field and the current density.
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Content and learning outcomes
Course contents
The general aim of the course is that you should be able to describe the function of components based on pn-junctions and MOS-structures These components include the MOS-transistor, the bipolar transistor and memory cells You should be able to explain, how the components are used in applications. You should be able to derive and calculate currents inside the components and be able to analyse the charge distribution, the electric field and the current density for given terminal voltages You should be familiar with the process flow that is used to produce modern microelectronics.
Intended learning outcomes
Having passed the course, the student shall be able to:
- describe the electronic band structure for insulators, semiconductors and metals qualitatively
- calculate electron and hole concentrations in semiconductors
- derive and calculate the current density in semiconductors and semiconductor components by means of the drift-diffusion model
- analyse and calculate the internal electrostatics (charges, electric field and potential) in semiconductor components based on pn and MOS-structures
- describe the function and the application areas for the pn-diode, the MOS-transistor and common types of memory cells and some kind of semiconductor sensor
- describe the basic properties for CMOS-inverters and how these are used to implement integrated circuits.
Course Disposition
No information inserted
Literature and preparations
Specific prerequisites
Analog electronics, electrostatics and modern physics.
Recommended prerequisites
Analogue and digital circuits, modern physics and basic electromagnetics.
Equipment
No information inserted
Literature
No information inserted
Examination and completion
If the course is discontinued, students may request to be examined during the following two academic years.
Grading scale
A, B, C, D, E, FX, F
Examination
- LABA - Laboration, 1,5 hp, betygsskala: P, F
- SEMA - Seminar, 1,5 hp, betygsskala: P, F
- TENA - Written Final Exam, 4,5 hp, betygsskala: A, B, C, D, E, FX, F
Based on recommendation from KTH’s coordinator for disabilities, the examiner will decide how to adapt an examination for students with documented disability.
The examiner may apply another examination format when re-examining individual students.
Opportunity to complete the requirements via supplementary examination
No information inserted
Opportunity to raise an approved grade via renewed examination
No information inserted
Examiner
Ethical approach
- All members of a group are responsible for the group's work.
- In any assessment, every student shall honestly disclose any help received and sources used.
- In an oral assessment, every student shall be able to present and answer questions about the entire assignment and solution.
Further information
Course web
Further information about the course can be found on the Course web at the link below. Information on the Course web will later be moved to this site.
Course web IH1611Offered by
Main field of study
Electrical Engineering, Technology
Education cycle
First cycle
Add-on studies
No information inserted
Contact
Gunnar Malm
Supplementary information
In this course, the EECS code of honor applies, see: http://www.kth.se/en/eecs/utbildning/hederskodex.
There is some overlap between the courses IH1611 and IH2651. These courses can therefore not be included together in a degree.