FKD3390 Physical Methods in Surface and Material Characterisation 3.0 credits

The course can be run as an intensive 1 week course with 4-6 hours of lectures per day, or can be spread over a longer period with a lower delivery rate

This course will provide a comprehensive overview of the most important and state of the art methods used in the characterization of materials.  The techniques covered include physical and spectroscopic methods of characterization, highlighting approaches to their use to define important attributes of the atomic, compositional/chemical, and mesoscopic/physical/morphological features of materials.

In addition to homework assignments, a final project grade for the course will ask the students to write a report that outlines the use of an important method of materials characterization, one either taken from the course or of the students choosing, within a plan of research addressing an important frontier area interest in materials chemistry.

• Methods and probes used in materials characterization.
• Surface Analysis
• Ion Beam Methods
• Microscopy
• Scanned Probe Methods
• Electron Microscopy
• Diffraction Methods
• Optical and Spectroscopic Methods
• Polymer Characterization

After completion of the course the doctoralstudent should have the knowledge and ability to

• demonstrate adequate acquired knowledge of the techniques to characterize surfaces and materials.
• Examine at least one of the techniques in greater depth, either as an example from own research or an example from the literature which is topical
• present and justify orally this study, and critically evaluate own and others’ presented studies.
• reflect on a selected materials characterisation problem with respect to solving it with tools from the course, and the environmental, human or societal aspects.

Eligible for studies at the third-cycle level

Utskrifter från  Powerpoint-presentationer/ Powerpoint material provided, samt videos inspelat på KTH/and videos recorded atKTH

Rekommenderad litteratur / Recommended reading

Watts, John F. and Wostenholme, John; An Introduction to Surface Analysis by XPS and AES, 2003 (Wiley

Goodhew, Peter J., Humphreys, F. J. and Beanland, R.; Electron Microscopy and Analysis, 2001 (Taylor and Francis)

If the course is discontinued, students may request to be examined during the following two academic years.

• INL1 - Hand in assignment, 2.5 credits, grading scale: P, F
• SEM1 - Seminars, 0.5 credits, grading scale: P, F

Based on recommendation from KTH’s coordinator for disabilities, the examiner will decide how to adapt an examination for students with documented disability.

The examiner may apply another examination format when re-examining individual students.

Approved seminar and homework.

Mark Rutland

• All members of a group are responsible for the group's work.
• In any assessment, every student shall honestly disclose any help received and sources used.
• In an oral assessment, every student shall be able to present and answer questions about the entire assignment and solution.

The entire course is on-line.