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Publications

Organic electronics

  • ROLLAND, Nicolas, FRANCO-GONZALEZ, Juan Felipe, VOLPI, Riccardo, et al. Understanding morphology-mobility dependence in PEDOT: Tos. Physical Review Materials, 2018, vol. 2, no 4, p. 045605.
  • FRANCO-GONZALEZ, Juan Felipe, ROLLAND, Nicolas, et ZOZOULENKO, Igor V. Substrate-Dependent Morphology and Its Effect on Electrical Mobility of Doped Poly (3, 4-ethylenedioxythiophene)(PEDOT) Thin Films. ACS applied materials & interfaces, 2018, vol. 10, no 34, p. 29115-29126.

Atom probe tomography, Field evaporation

  • KATNAGALLU, Shyam, DAGAN, Michal, PARVIAINEN, Stefan, et al. Impact of local electrostatic field rearrangement on field ionization. Journal of Physics D: Applied Physics, 2018, vol. 51, no 10, p. 105601.
  • VURPILLOT, François, ZANUTTINI, David, PARVIAINEN, Stefan, et al. Reconstructing APT Datasets: Challenging the Limits of the Possible. Microscopy and Microanalysis, 2017, vol. 23, no S1, p. 640-641.
  • BARNES, J. P., GRENIER, A., MOUTON, I., et al. Atom probe tomography for advanced nanoelectronic devices: Current status and perspectives. Scripta Materialia, 2018, vol. 148, p. 91-97.
  • ROLLAND, Nicolas, VURPILLOT, François, DUGUAY, Sébastien, et al. New Atom Probe Tomography Reconstruction Algorithm for Multilayered Samples: Beyond the Hemispherical Constraint. Microscopy and Microanalysis, 2017, vol. 23, no 2, p. 247-254.
  • VURPILLOT, F., ROLLAND, N., ESTIVILL, R., et al. Accuracy of analyses of microelectronics nanostructures in atom probe tomography. Semiconductor Science and Technology, 2016, vol. 31, no 7, p. 074002.
  • ROLLAND, Nicolas, VURPILLOT, François, DUGUAY, Sébastien, et al. A meshless algorithm to model field evaporation in atom probe tomography. Microscopy and Microanalysis, 2015, vol. 21, no 6, p. 1649-1656.
  • ROLLAND, Nicolas, VURPILLOT, François, DUGUAY, Sébastien, et al. Dynamic evolution and fracture of multilayer field emitters in atom probe tomography: a new interpretation. The European Physical Journal Applied Physics, 2015, vol. 72, no 2, p. 21001.
  • GRENIER, A., DUGUAY, S., BARNES, J. P., et al. Three dimensional imaging and analysis of a single nano-device at the ultimate scale using correlative microscopy techniques. Applied Physics Letters, 2015, vol. 106, no 21, p. 213102.
  • ROLLAND, N., LARSON, D. J., GEISER, B. P., et al. An analytical model accounting for tip shape evolution during atom probe analysis of heterogeneous materials. Ultramicroscopy, 2015, vol. 159, p. 195-201.
Profilbild av Nicolas Rolland

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