Methods and Instruments of Analysis
Advanced materials analysis is of crucial importance for an increasing amount of high-tech applications based on control and understanding of material properties down to the atomic scale. This includes structural, optical, electrical, and other physical properties and often requires a plethora of different and complementary methods for a full analysis and understanding.
This course aims to give an overview of a range of analytical methods and instruments of particular importance for applied materials research and nanotechnology. These include ion beam-based methods, electron microscopies, scanning probe microscopy, X-ray diffraction, electric and optical methods, as well as electron and photon spectroscopies. Extensive laboratory exercises provide the students with the opportunity to hands-on test various analytical tools that are available at the ICT School research departments.
- Alexey Metreveli Teacher
- Anders Hallén Teacher
- Corrado Carlo Maria Capriata Teacher
- Gunnar Malm Teacher
- Ilja Sytjugov Teacher
- Jiantong Li Teacher
- Jonas Weissenrieder Teacher
- Laura Zurauskaite Teacher
- Mattias Hammar Examiner, Course responsible
- Muhammet Toprak Teacher
- Szymon Sollami Delekta Teacher
- Viktoriia Mishukova Teacher