Atomic Force Microscope (AFM)

The atomic force microscope (AFM) can be used conventionally to obtain topographic information of a surface on the nanometer scale. More advanced areas of utilization include force and friction interactions measured using the versatile colloidal probe technique which allows for studies between almost any types of materials. Additionally the high resolution of the measured forces makes it possible to investigate singular species of synthetic polymers or bio-macromolecules by using the single molecular force spectroscopy technique (SMFS).