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Study of the Back-to-Back Test Method for Embedded Systems in Hardware-Software Integration Context

Shangning Wang presents his MSc project work. Welcome!

Time: Wed 2013-11-13 14.00

Location: KTH Campus, Maskinkonstruktion, Brinellvägen 83, rum B242

Participating: Shangning Wang

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Title: Study of the Back-to-Back Test Method for Embedded Systems in Hardware-Software Integration Context

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