Study of the Back-to-Back Test Method for Embedded Systems in Hardware-Software Integration Context
Shangning Wang presenterar sitt examensarbete. Välkomna!
Tid: On 2013-11-13 kl 14.00
Plats: KTH Campus, Maskinkonstruktion, Brinellvägen 83, rum B242
Medverkande: Shangning Wang
Titel på arbetet: Study of the Back-to-Back Test Method for Embedded Systems in Hardware-Software Integration Context