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Radiation hardness and accelerated testing of electronics

Tid: Fr 2019-05-17 kl 10.00 - 12.00

Plats: KTH EECS Kista Sal 205, Kistagången 16

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Reliability needs for electronics is steadily increasing and radiation is one important source for failures in electronic systems, both in space and in terrestrial environments. The workshop will address this issue and present methods to test electronics for radiation hardness and also highlight the introduction of wide bandgap semiconductors, which are inherently more radiation hard than prevailing silicon.

The program:

10:00-10:20 Coffe
10.20-10.40 Radiation problems for Electronics, S. S. Suvanam, ÅAC Microtec
10.40-11.00 Neutron facilities and standards for accelerated testing of electronics, Alexander Prokofiev, UU
11.00-11.20 The emerging NESSA neutron facility at Uppsala University, Erik Andersson Sundén, UU
11.20-11.40 Radiation hardness of wide bandgap semiconductors, A. Hallén, KTH
11.40- Discussion

For the seminars webpage visit:

Radiation hardness and accelerated testing of electronics

Innehållsansvarig:Ceona Lindstein
Tillhör: KTH Rymdcenter
Senast ändrad: 2019-05-09