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Training to be a licensed user of the Ion Polisher

Training on how to use the JEOL Ion Beam Polisher - the new SEM sample preparation tool

Time: Wed 2024-01-24 13.00 - 15.00

Location: Hultgren Lab - TEM Sample Preparation Room

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A new JEOL Ion Beam Cross Section Polisher (CP) has just been installed in the Hultgren Laboratory.

The new ion beam polisher is a useful sample preparation tool for materials that are environment- and beam-sensitive, such as metals, polymers, ceramics and composites. For these materials, pristine, damage free samples can be produced by the ion beam technique. The ion beam technique also enables the preparation of smooth surfaces when the material is a hard metal.

Be one of the first licenced users for the Ion Beam polisher.