Calendar
Mon 29 April  Sun 05 May

29AprSeminar, Theoretical computer scienceMonday 20190429, 12:00Lecturer: Jonah BrownCohenLocation: Room 4523, Lindstedtsvägen 5  floor 5, KTH20190429T12:00:00.000+02:00 20190429T12:00:00.000+02:00 Jonah BrownCohen: Extended Formulation Lower Bounds for Refuting Random CSPs (Seminar, Theoretical computer science) Jonah BrownCohen: Extended Formulation Lower Bounds for Refuting Random CSPs (Seminar, Theoretical computer science)

30AprTopological ActivitiesTuesday 20190430, 13:15  15:00Lecturer: Emanuele Dotto (Bonn)Location: Room 35, House 5, Kräftriket campus, Stockholm University20190430T13:15:00.000+02:00 20190430T15:00:00.000+02:00 Emanuele Dotto: Witt vectors with coefficients and the components of the HillHopkinsRavenel norm (Topological Activities) Emanuele Dotto: Witt vectors with coefficients and the components of the HillHopkinsRavenel norm (Topological Activities)

30AprSeminar, Random matrix theoryTuesday 20190430, 15:15  16:15Lecturer: Nicos GeorgiouLocation: Room F11, KTH20190430T15:15:00.000+02:00 20190430T16:15:00.000+02:00 Nicos Georgiou: Last passage times in discontinuous inhomogeneous environments (Seminar, Random matrix theory) Nicos Georgiou: Last passage times in discontinuous inhomogeneous environments (Seminar, Random matrix theory)

1MaySeminar, LogicWednesday 20190501, 10:00  11:45Lecturer: Joseph Helfer, Stanford UniversityLocation: Room 16, building 5, Kräftriket, Department of Mathematics, Stockholm University20190501T10:00:00.000+02:00 20190501T11:45:00.000+02:00 Joseph Helfer: FirstOrder Homotopical Logic (Seminar, Logic) Joseph Helfer: FirstOrder Homotopical Logic (Seminar, Logic)

3MaySeminar, Graduate studentFriday 20190503, 13:15  14:00Lecturer: Martin RynerLocation: Room 3418, Lindstedtsvägen 25, 4th floor, Department of Mathematics, KTH20190503T13:15:00.000+02:00 20190503T14:00:00.000+02:00 Martin Ryner: Automation of the control and analysis to reduce risk of errors in electron microscopy. (Seminar, Graduate student) Martin Ryner: Automation of the control and analysis to reduce risk of errors in electron microscopy. (Seminar, Graduate student)