TEM Transmission Electron Microscopy

JEOL JEM-2100F is an advanced Field Emission TEM. Electron gun composes of ZrO/W(100) emitter with accelerating voltage 80 kV-200 kV, providing point resolution 0.23 nm and lattice resolution 0.10 nm. Magnification is from 50× to 1 500 000×.

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Hitachi TEM HT7700 (Japan), equipped with the 2k × 2k CCD camera (AMT XR41, USA) and a W filament. It is a low-voltage (up to 120 kV), low-dose instrument, very suitable for the analysis of beam sensitive materials.

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Ultrafast Electron Microscope (UEM) or time resolved transmission electron microscope (TEM) with a time resolution of a few hundred femtoseconds. Capacity to perform time resolved TEM imaging, diffraction and electron energy loss spectroscopy (EELS), Lorentz microscopy, energy filtered imaging, etc.

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FE-TEM Jeol 2100F can be operated at room and cryogenic temperature (200 kV TEM). It is equipped with two detectors: a Direct Electron DE20 direct detection camera and a Tietz CCD camera (4k x 4k).

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