Atom probe tomography (APT)
APT is a powerful material analysis technique with three-dimensional capabilities and near atomic spatial resolution. Equal detection efficiency for all elements gives quantitative composition analysis from the sub-nm to the near micron range.
The EIKOS-UV instrument is a workhorse APT equipped with a UV-laser which widens the application range including metals, coatings, thin films, ceramics, minerals, functional materials.
The instrument uses an integrated local electrode (ILE) design. This means that only wire geometry samples are accepted. Samples and ILE are mounted to the specimen puck ex-situ.
Auxiliary equipment includes an electropolishing micro-loop for production of specimens from a wide variety of materials, and advanced accessories for FIB-based specimen preparation.
Technical information:
- Flight path type: Large Angle Reflectron.
- Detection efficiency: 36%.
- Minimum specimen temperature (K): 40.
- Voltage Pulse Amplitude (max.): 2000V.
- Voltage Pulse Repetition Rate (max.): 100 kHz.
- Laser Pulse Repetition Rate (max.): 200 kHz.
- Laser wavelength: 355 nm.
- Laser Spot size (diameter): ≤ 5 micron.
- Minimum detection rate (DR, %): 0.10%.
- Software: APSuite.
More information about the equipment:
