X-ray diffraction
With our two X-ray diffractometers we have equipment for all types of measurements of atomic arrangements in crystals.
X-ray diffraction is a method to determine the atomic arrangements in a crystal. Incident X-rays with a well-known wavelength diffract on the periodically arranged atoms the material consists of. Depending on the atomic spacing, the diffraction occurs in specific angles in which the diffracted X-ray can be collected. In material science, X-ray diffraction (and related techniques) is a useful tool for:
- Crystallography
- Phase analysis
- Texture measurements
- Grain size (sub-micron) determination
- Strain/stress analysis
- Defect analysis
- Surface film thickness
We have two X-ray diffractometers (Bruker D8 Discover and Siemens D5000) capable of all types of measurements.
All tools at Hultgren Laboratory
