Techniques

APT is a powerful material analysis technique with three-dimensional capabilities and near atomic spatial resolution. Equal detection efficiency for all elements gives quantitative composition analysis from the sub-nm to the near micron range.

A quenching & deformation dilatometer and a high temperature dilatometer of connecting / pushing rod type.

Two different electron microscopes with EBSD detectors, provides both high speed and high resolution.

We have three different sets of scanning and transmission electron microscopes, of both detector and ion beam type.

An ion beam equipped microscope with field emission electron source and a gallium ion source.

High temperature confocal laser scanning microscopy (HT-CLSM) allows the in-situ study of phase transformations at high temperatures for diverse materials.

Magnetometers, a thermogravimetric balance and a highly sensitive alternating field magnetic susceptometer make up a complete magnetic measuring instrumentation at the lab.

A micro-hardness tester that operates under a heavy load range. Attachable to an optical microscope.

Advanced nanoindentation used with electron microscopes, measures the relationship between the force and depth of a diamond tip during the indentation process in the surface.

Microscopes with high precision optical lenses for studying surfaces in extreme detail.

Scanning probe microscopes are used to study surface topography or depth resolution. We have three different types at the lab.

A state-of-the-art facility for simultaneous thermal analysis and an connectable mass spectrometer.

Scanning electron microscopes equipped with energy and wavelength x-ray spectroscopy make it is possible to combine chemical analysis with imaging or crystal structure analysis.

With our two X-ray diffractometers we have equipment for all types of measurements of atomic arrangements in crystals.