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Advanced nanoindentation used with electron microscopes, measures the relationship between the force and depth of a diamond tip during the indentation process in the surface.


We have recently acquired a set of high-end nanoindenters for use ex-situ and in-situ within our focused ion beam electron microscope (FIB-SEM). Depth sensing accuracy is better than 100pm, and positioning accuracy better than 1nm. These instruments are also optimized for very high speed of displacement control, so cracks and bursts of failing material can be recorded and quantified.

All tools at Hultgren Laboratory