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SEM JEOL JSM-6490LV (2MILab)

SEM JEOL JSM-6490LV is equipped with LaB6 filament, secondary electron, backscattered and JEOL EX-54165JMH EDS detectors. Maximum resolution is 3 nm. C and Au sputters are available. This instrument is used mainly for laboratory work and demonstration within master and bachelor courses at CBH, KTH and for preliminary studies of samples’ morphology and composition.

JEOL JSM-6490LV microscope.

To booking page for JEOL JSM-6490LV

Main contact person: Inna Soroka ( soroka@kth.se ).

Location: Teknikringen 30

2MILab – The “Molecules and Materials at Interfaces” laboratory, 2milab.cbh.kth.se

Division of Applied Physical Chemistry