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FE-SEM Hitachi S-4800 (FPT)

High-resolution high-vacuum cold field-emission Hitachi SEM S-4800 (Japan). It is equipped with SE, BSE, STEM and EDS detectors (X-Max 80 SDD EDS detector from Oxford Instruments, UK). For sample grounding the Cressington sputter coater 208HR (Pt:Pd target) is used.

High-resolution high-vacuum cold field-emission microscope Hitachi SEM S-4800.

To booking page for FE-SEM Hitachi S-4800

Main contact person: Anastasia Riazanova ( anaria@kth.se )

Location: Teknikringen 56

Department of Fibre and Polymer Technology www.kth.se/fpt