SEM Hitachi S3700N (Hultgren)
Hitachi SEM S-3700N is equipped with a thermionic W filament and following detectors: ETD SE, high-sensitivity semiconductor five-segment BSE, Bruker windowless EDS and WDS detectors.
It can be operated at a variable pressure (VP) mode, which allows observation of most samples in their natural state or in a wet condition, without the need for metal coating and even in the environmental mode (ESEM). The S-3700N has an extra-large sample chamber that can accommodate samples as large as 300 mm in diameter and 110 mm tall. It has 5-axis motorized stage with eucentric tilt and rotation, an image navigation system, stage history, stage memory, click-to-center and a user-friendly GUI design. The display system allows a full-frame, flicker-free, high-pixel density and real-time imaging. It also allows simultaneous display of images from two different detectors, each having different sample information, including signal mixing in real-time.
To booking page for Hitachi SEM S-3700N
Main contact person: Wen-Li Long ( wenli@kth.se ).
Location: Brinellvägen 23, Hultgren Laboratory, www.kth.se/hultgrenlab
Department of Materials Science and Engineering, www.mse.kth.se