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  • Thermal analysis

    A state-of-the-art facility for simultaneous thermal analysis and an connectable mass spectrometer.

  • Magnetic measurements

    Magnetometers, a thermogravimetric balance and a highly sensitive alternating field magnetic susceptometer make up a complete magnetic measuring instrumentation at the lab.

  • Optical microscopy

    Microscopes with high precision optical lenses for studying surfaces in extreme detail.

  • Micro-hardness

    A micro-hardness tester that operates under a heavy load range. Attachable to an optical microscope.

  • Scanning probe microscopy

    Scanning probe microscopes are used to study surface topography or depth resolution. We have three different types at the lab.

  • Focused ion beam

    An ion beam equipped microscope with field emission electron source and a gallium ion source.

  • Electron microscopy

    We have three different sets of scanning and transmission electron microscopes, of both detector and ion beam type.

  • Electron backscatter diffraction (EBSD)

    Two different electron microscopes with EBSD detectors, provides both high speed and high resolution.

  • Nanoindentation

    Advanced nanoindentation used with electron microscopes, measures the relationship between the force and depth of a diamond tip during the indentation process in the surface.

  • X-ray diffraction

    With our two X-ray diffractometers we have equipment for all types of measurements of atomic arrangements in crystals.

  • X-ray Spectroscopy EDS, WDS

    Scanning electron microscopes equipped with energy and wavelength x-ray spectroscopy make it is possible to combine chemical analysis with imaging or crystal structure analysis.

  • Atom probe tomography (APT)

    APT is a powerful material analysis technique with three-dimensional capabilities and near atomic spatial resolution. Equal detection efficiency for all elements gives quantitative composition analysis from the sub-nm to the near micron range.

  • Deformation dilatometry

    A quenching & deformation dilatometer and a high temperature dilatometer of connecting / pushing rod type.

  • High temperature confocal laser scanning microscopy (HT-CLSM)

    High temperature confocal laser scanning microscopy (HT-CLSM) allows the in-situ study of phase transformations at high temperatures for diverse materials.