Search by tag
Number of hits: 14
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Thermal analysis
A state-of-the-art facility for simultaneous thermal analysis and an connectable mass spectrometer.
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Magnetic measurements
Magnetometers, a thermogravimetric balance and a highly sensitive alternating field magnetic susceptometer make up a complete magnetic measuring instrumentation at the lab.
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Optical microscopy
Microscopes with high precision optical lenses for studying surfaces in extreme detail.
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Micro-hardness
A micro-hardness tester that operates under a heavy load range. Attachable to an optical microscope.
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Scanning probe microscopy
Scanning probe microscopes are used to study surface topography or depth resolution. We have three different types at the lab.
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Focused ion beam
An ion beam equipped microscope with field emission electron source and a gallium ion source.
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Electron microscopy
We have three different sets of scanning and transmission electron microscopes, of both detector and ion beam type.
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Electron backscatter diffraction (EBSD)
Two different electron microscopes with EBSD detectors, provides both high speed and high resolution.
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Nanoindentation
Advanced nanoindentation used with electron microscopes, measures the relationship between the force and depth of a diamond tip during the indentation process in the surface.
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X-ray diffraction
With our two X-ray diffractometers we have equipment for all types of measurements of atomic arrangements in crystals.
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X-ray Spectroscopy EDS, WDS
Scanning electron microscopes equipped with energy and wavelength x-ray spectroscopy make it is possible to combine chemical analysis with imaging or crystal structure analysis.
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Atom probe tomography (APT)
APT is a powerful material analysis technique with three-dimensional capabilities and near atomic spatial resolution. Equal detection efficiency for all elements gives quantitative composition analysis from the sub-nm to the near micron range.
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Deformation dilatometry
A quenching & deformation dilatometer and a high temperature dilatometer of connecting / pushing rod type.
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High temperature confocal laser scanning microscopy (HT-CLSM)
High temperature confocal laser scanning microscopy (HT-CLSM) allows the in-situ study of phase transformations at high temperatures for diverse materials.